Time of flight photoelectron spectroscopy with a laser‐plasma x‐ray source

Applied Physics Letters ◽

10.1063/1.117365 ◽

1996 ◽

Vol 69 (2) ◽

pp. 182-184 ◽

Author(s):

Hiroyuki Kondo ◽

Toshihisa Tomie ◽

Hideaki Shimizu

Keyword(s):

Laser Plasma ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

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Time-of-flight photoelectron spectroscopy with a laser-plasma x-ray source

Technical Digest. CLEO/Pacific Rim'95. The Pacific Rim Conference on Lasers and Electro-Optics ◽

10.1109/cleopr.1995.521266 ◽

2005 ◽

Author(s):

H. Kondo ◽

T. Tomie ◽

H. Shimizu

Keyword(s):

Laser Plasma ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Interaction of Bovine Serum Albumin and Lysozyme with Stainless Steel Studied by Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Langmuir ◽

10.1021/la3039279 ◽

2012 ◽

Vol 28 (47) ◽

pp. 16306-16317 ◽

Author(s):

Yolanda S. Hedberg ◽

Manuela S. Killian ◽

Eva Blomberg ◽

Sannakaisa Virtanen ◽

Patrik Schmuki ◽

...

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Bovine Serum Albumin ◽

Serum Albumin ◽

Photoelectron Spectroscopy ◽

Bovine Serum ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

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Initial adsorption kinetics of oxygen on a Cu0.82Li0.18 alloy surface studied by combined Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and time‐of‐flight spectrometry of direct recoils

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574817 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1136-1141 ◽

Author(s):

M. H. Mintz ◽

U. Atzmony ◽

J. A. Schultz ◽

N. Shamir

Keyword(s):

Auger Electron Spectroscopy ◽

Adsorption Kinetics ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Time Of Flight ◽

Alloy Surface ◽

X Ray ◽

Initial Adsorption ◽

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Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

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Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578851 ◽

1994 ◽

Vol 12 (3) ◽

pp. 671-676 ◽

Author(s):

P. W. Jahn ◽

F. M. Petrat ◽

D. Wolany ◽

M. Deimel ◽

T. Gantenfort ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

On Line ◽

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Study of the interaction of sulphate-reducing bacteria exopolymers with iron using X-ray photoelectron spectroscopy and time-of-flight secondary ionisation mass spectrometry

Journal of Microbiological Methods ◽

10.1016/s0167-7012(99)00005-6 ◽

1999 ◽

Vol 36 (1-2) ◽

pp. 3-10 ◽

Author(s):

I.B Beech ◽

V Zinkevich ◽

R Tapper ◽

R Gubner ◽

R Avci

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Time Of Flight ◽

X Ray ◽

Sulphate Reducing Bacteria ◽

Ionisation Mass Spectrometry ◽

Reducing Bacteria ◽

Ionisation Mass

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97/05172 Identification of inorganic nitrogen in an Australian bituminous coal using X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOFSIMS)

Fuel and Energy Abstracts ◽

10.1016/s0140-6701(97)82445-9 ◽

1997 ◽

Vol 38 (6) ◽

pp. 448-449

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Bituminous Coal ◽

Secondary Ion Mass Spectrometry ◽

Inorganic Nitrogen ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Aluminum chemical vapor deposition reaction of dimethylaluminum hydride on TiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/s0169-4332(00)00542-0 ◽

2001 ◽

Vol 171 (1-2) ◽

pp. 71-81 ◽

Author(s):

Kozo Tanaka ◽

Hiroyuki Yanashima ◽

Tadaaki Yako ◽

Kunimasa Kamio ◽

Kazumi Sugai ◽

...

Keyword(s):

Mass Spectrometry ◽

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Vapor ◽

X Ray ◽

Secondary Ion ◽

Chemical Vapor Deposition Reaction

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Analysis of stoichiometry and oxide growth of HF treated GaAs (100) by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587172 ◽

1994 ◽

Vol 12 (1) ◽

pp. 147 ◽

Author(s):

W. Storm

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Oxide Growth ◽

X Ray ◽

Ion Mass Spectrometry ◽

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