Observation of the size-dependent blueshifted electroluminescence from nanocrystalline Si fabricated by KrF excimer laser annealing of hydrogenated amorphous silicon/amorphous-SiNx:H superlattices

1998 ◽  
Vol 72 (6) ◽  
pp. 722-724 ◽  
Author(s):  
Mingxiang Wang ◽  
Xinfan Huang ◽  
Jun Xu ◽  
Wei Li ◽  
Zhiguo Liu ◽  
...  
1999 ◽  
Vol 75 (4) ◽  
pp. 498-500 ◽  
Author(s):  
G. Ivlev ◽  
E. Gatskevich ◽  
V. Cháb ◽  
J. Stuchlı́k ◽  
V. Vorlı́ček ◽  
...  

2006 ◽  
Vol 958 ◽  
Author(s):  
Shinji Munetoh ◽  
Takanori Mitani ◽  
Takahide Kuranaga ◽  
Teruaki Motooka

ABSTRACTWe have performed molecular-dynamics simulations of heating, melting and recrystallization processes in amorphous silicon (a-Si) thin films deposited on glass during excimer laser annealing. By partially heating the a-Si surface region with 2 nm depth and removing thermal energy from the bottom of the glass substrate, a steady-state temperature profile was obtained in the a-Si layer with the thickness of 15 nm and only the surface region was melted. It was found that nucleation predominantly occurred in the a-Si region as judged by the coordination numbers and diffusion constants of atoms in the region. The results suggest that nucleation occurs in unmelted residual a-Si region during the laser irradiation and then crystal growth proceeds toward liquid Si region under the near-complete melting condition.


1995 ◽  
Vol 377 ◽  
Author(s):  
H. S. Choi ◽  
K. H. Jang ◽  
K. B. Kim ◽  
M. K. Han

ABSTRACTThe Effects of fluorine atoms on laser-induced crystallization have been studied. The defect states of hydrogenated amorphous silicon (a-Si:H) film, which are related to weak hydrogen bonds, were reduced by involving fluorine atoms, before laser annealing. In laser annealing, the crystallinity was also enhanced to 63 %, while that of a-Si:H was 45 % at the energy density of 300 mJ/cm2. It may be considered that the fluorine atoms reduce the hydrogen atoms cause to the degradation of film in laser annealing, and increase the heat capacity which results in promotion of crystallinity in melt-solid phase transition.


2010 ◽  
Vol 13 (10) ◽  
pp. H346 ◽  
Author(s):  
Moojin Kim ◽  
GuangHai Jin ◽  
Hoonkee Min ◽  
HoKyoon Chung ◽  
Sangsoo Kim ◽  
...  

1995 ◽  
Vol 397 ◽  
Author(s):  
P. Boher ◽  
M. Stehle ◽  
B. Godard ◽  
J.L. Stehle

ABSTRACTPECVD amorphous silicon films deposited at different temperatures on low cost glass substrates have been treated by a Single Shot Excimer Laser Annealing (SSELA) at various energy densities. The influence of a thermal treatment at medium temperature (400°C) prior to the SSELA treatment was also investigated. Spectroscopie ellipsometry and Raman characterizations show that hydrogen contamination produces an important roughness increase with very little polycrystalline grains (650nm) after laser treatment. The thermal treatment prior laser annealing improves drastically the structural quality of the films. Structural results are correlated with the electrical performances of the TFT produced on these films.


2002 ◽  
Vol 46 (8) ◽  
pp. 1085-1090 ◽  
Author(s):  
Chang-Ho Tseng ◽  
Ching-Wei Lin ◽  
Teh-Hung Teng ◽  
Ting-Kuo Chang ◽  
Huang-Chung Cheng ◽  
...  

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