Electrically neutral nitrogen dangling‐bond defects in amorphous hydrogenated silicon nitride thin films
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Keyword(s):
1993 ◽
pp. 421-426
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Keyword(s):
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1996 ◽
Vol 43
(9)
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pp. 1592-1601
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2003 ◽
Vol 17
(09)
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pp. 387-392
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