scholarly journals Determination of Λ‐doublet resolved cross‐sections for inelastic scattering of OH by para‐ and normal‐H2

1996 ◽  
Vol 105 (11) ◽  
pp. 4522-4532 ◽  
Author(s):  
K. Schreel ◽  
J.J. ter Meulen
Keyword(s):  
Inelastic Scattering ◽  
Cross Sections

Analysis of STEM micrographs of thick objects

1978 ◽  
Vol 36 (2) ◽  
pp. 106-107
Author(s):  
S. Golladay
Keyword(s):  
Inelastic Scattering ◽  
Multiple Scattering ◽  
Mass Distribution ◽  
Cross Sections ◽  
Phase Contrast ◽  
Image Point ◽  
Contrast Effects ◽  
Total Cross Sections ◽  
Elastic And Inelastic Scattering

The theory of multiple scattering has been worked out by Groves and comparisons have been made between predicted and observed signals for thick specimens observed in a STEM under conditions where phase contrast effects are unimportant. Independent measurements of the collection efficiencies of the two STEM detectors, calculations of the ratio σe/σi = R, where σe, σi are the total cross sections for elastic and inelastic scattering respectively, and a model of the unknown mass distribution are needed for these comparisons. In this paper an extension of this work will be described which allows the determination of the required efficiencies, R, and the unknown mass distribution from the data without additional measurements or models. Essential to the analysis is the fact that in a STEM two or more signal measurements can be made simultaneously at each image point.

scholarly journals Inclusive jet cross sections in the Breit frame in neutral current deep inelastic scattering at HERA and determination of αs

2002 ◽  
Vol 547 (3-4) ◽  
pp. 164-180 ◽  
Author(s):  
S. Chekanov ◽  
D. Krakauer ◽  
S. Magill ◽  
B. Musgrave ◽  
J. Repond ◽  
...  
Keyword(s):  
Inelastic Scattering ◽  
Deep Inelastic Scattering ◽  
Cross Sections ◽  
Neutral Current ◽  
Inclusive Jet ◽  
Jet Cross Sections

Experimental determination of electron inelastic scattering cross-sections in Si, Ge and III–V semiconductors

Vacuum ◽  
2003 ◽  
Vol 71 (1-2) ◽  
pp. 147-152 ◽  
Author(s):  
G.T Orosz ◽  
G Gergely ◽  
S Gurban ◽  
M Menyhard ◽  
J Toth ◽  
...  
Keyword(s):  
Inelastic Scattering ◽  
Experimental Determination ◽  
Cross Sections ◽  
Scattering Cross ◽  
Scattering Cross Sections

scholarly journals MULTIJET PRODUCTION IN NEUTRAL CURRENT DEEP INELASTIC SCATTERING AT HERA AND DETERMINATION OF αs

2005 ◽  
Vol 20 (08n09) ◽  
pp. 2002-2005
Author(s):  
LIANG LI
Keyword(s):  
Inelastic Scattering ◽  
Deep Inelastic Scattering ◽  
Cross Sections ◽  
Transverse Energy ◽  
Neutral Current ◽  
Coupling Constant ◽  
Centre Of Mass ◽  
Multijet Production ◽  
Energy Formula

Multijet production rates in neutral current deep inelastic scattering (DIS) have been measured in the range of exchanged boson virtualities 10<Q2<5000 GeV2. The data were taken at the ep collider HERA with centre-of-mass energy [Formula: see text] using the ZEUS detector and correspond to an integrated luminosity of 82.2 pb-1. Jets were identified in the Breit frame using the kTcluster algorithm in the longitudinally invariant inclusive mode. Measurements of differential multijet cross sections are presented as functions of jet transverse energy [Formula: see text], pseudorapidity [Formula: see text] and Q2with [Formula: see text] and [Formula: see text]. Next-to-leading-order QCD calculations describe the data well. The value of the strong coupling constant αs(MZ), determined from the ratio of the trijet to dijet cross sections, is [Formula: see text].

A quantitative approach to inner shell losses

1978 ◽  
Vol 36 (1) ◽  
pp. 526-527 ◽  
Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers
Keyword(s):  
Energy Transfer ◽  
Cross Section ◽  
Cross Sections ◽  
Accurate Determination ◽  
Background Intensity ◽  
Core Excitation ◽  
Quantitative Basis ◽  
Cross Section Differential ◽  
Bound Electrons

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as

Preparation And elemental analysis of ancient fibers

1987 ◽  
Vol 45 ◽  
pp. 410-411
Author(s):  
Allen Angel ◽  
Kathryn A. Jakes
Keyword(s):  
Cross Sections ◽  
Physical Structure ◽  
Energy Dispersive ◽  
Archaeological Sites ◽  
X Ray ◽  
Long Term Storage ◽  
Backscattered Electron ◽  
Electron Imaging

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.

Determination of arsenic atom distribution arsenic doped silicon using HOLZ-line analysis

1996 ◽  
Vol 54 ◽  
pp. 976-977
Author(s):  
Y. Kikuchi ◽  
N. Hashikawa ◽  
F. Uesugi ◽  
E. Wakai ◽  
K. Watanabe ◽  
...  
Keyword(s):  
Inelastic Scattering ◽  
Zone Axis ◽  
Experimental Result ◽  
Background Intensity ◽  
Crystal Thickness ◽  
Arsenic Atom ◽  
Doped Silicon ◽  
P Type ◽  
Line Analysis

In order to measure the concentration of arsenic atoms in nanometer regions of arsenic doped silicon, the HOLZ analysis is carried out underthe exact [011] zone axis observation. In previous papers, it is revealed that the position of two bright lines in the outer SOLZ structures on the[011] zone axis is little influenced by the crystal thickness and the background intensity caused by inelastic scattering electrons, but is sensitive to the concentration of As atoms substitutbnal for Siatomic site.As the result, it becomes possible to determine the concentration of electrically activated As atoms in silicon within an observed area by means of the simple fitting between experimental result and dynamical simulatioan. In the present work, in order to investigate the distribution of electrically activated As in silicon, the outer HOLZ analysis is applied using a nanometer sized probe of TEM equipped with a FEG.Czodiralsld-gown<100>orientated p-type Si wafers with a resistivity of 10 Ώ cm are used for the experiments.TheAs+ implantation is performed at a dose of 5.0X1015cm-2at 25keV.

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