Negative gate-bias temperature stability of N-doped InGaZnO active-layer thin-film transistors

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Kyungsoo Jang ◽  
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Woojin choi ◽  
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2014 ◽  
Vol 40 (1) ◽  
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Han-Yu Lin ◽  
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2016 ◽  
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RSC Advances ◽  
2021 ◽  
Vol 11 (29) ◽  
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Liuhui Lei ◽  
Yuanyuan Tan ◽  
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Flexible electric-double-layer (EDL) thin film transistors (TFTs) based on a vertical InGaZnO4 (IGZO) channel are fabricated at room temperature.


2021 ◽  
Author(s):  
Om Kumar Prasad ◽  
Srikant Kumar Mohanty ◽  
ChienHung Wu ◽  
Tsung Ying Yu ◽  
K-M Chang

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Vol 66 ◽  
pp. 53-57 ◽  
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Yasin Kanbur ◽  
Halime Coskun ◽  
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...  

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