Negative gate-bias temperature stability of N-doped InGaZnO active-layer thin-film transistors
Keyword(s):
2012 ◽
Vol 59
(1)
◽
pp. 151-158
◽
Keyword(s):
2019 ◽
Vol 111
◽
pp. 165-169
◽
2016 ◽
Vol 16
(10)
◽
pp. 10373-10379
◽
Keyword(s):
2016 ◽
Vol 47
(1)
◽
pp. 1186-1188
◽
Keyword(s):
Keyword(s):
2012 ◽
Vol 30
(4)
◽
pp. 041208
◽
Keyword(s):