Positive Gate-Bias Temperature Stability of RF-Sputtered $\hbox{Mg}_{0.05}\hbox{Zn}_{0.95}\hbox{O}$ Active-Layer Thin-Film Transistors
2012 ◽
Vol 59
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pp. 151-158
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2019 ◽
Vol 111
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pp. 165-169
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2016 ◽
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