Model for determination of mid-gap states in amorphous metal oxides from thin film transistors

2013 ◽  
Vol 113 (23) ◽  
pp. 234507 ◽  
Author(s):  
S. Bubel ◽  
M. L. Chabinyc
Keyword(s):  
Thin Film ◽  
Metal Oxides ◽  
Thin Film Transistors ◽  
Amorphous Metal ◽  
Gap States ◽  
Amorphous Metal Oxides

Cyclical Annealing Technique To Enhance Reliability of Amorphous Metal Oxide Thin Film Transistors

2018 ◽  
Vol 10 (31) ◽  
pp. 25866-25870 ◽  
Author(s):  
Hong-Chih Chen ◽  
Ting-Chang Chang ◽  
Wei-Chih Lai ◽  
Guan-Fu Chen ◽  
Bo-Wei Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Thin Film Transistors ◽  
Amorphous Metal ◽  
Oxide Thin Film ◽  
Metal Oxide Thin Film ◽  
Amorphous Metal Oxide

Influence of gap states on the electrical stability of pentacene thin film transistors

2008 ◽  
Vol 354 (19-25) ◽  
pp. 2875-2878 ◽  
Author(s):  
A. Benor ◽  
D. Knipp ◽  
J. Northrup ◽  
A.R. Völkel ◽  
R.A. Street
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Electrical Stability ◽  
Gap States
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