Effect of conductive atomic force microscope tip loading force on tip-sample interface electronic characteristics: Unipolar to bipolar resistive switching transition

2013 ◽  
Vol 103 (5) ◽  
pp. 051604 ◽  
Author(s):  
Bharti Singh ◽  
Deepak Varandani ◽  
B. R. Mehta
Keyword(s):  
Atomic Force Microscope ◽  
Resistive Switching ◽  
Bipolar Resistive Switching ◽  
Atomic Force

scholarly journals Формирование наноразмерных ферромагнитных филаментов Ni в пленках ZrO-=SUB=-2-=/SUB=-(Y)

2021 ◽  
Vol 47 (11) ◽  
pp. 30
Author(s):  
Д.А. Антонов ◽  
А.С. Новиков ◽  
Д.О. Филатов ◽  
А.В. Круглов ◽  
И.Н. Антонов ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Resistive Switching ◽  
Magnetic Force ◽  
Single Domain ◽  
Ferromagnetic Particle ◽  
Conducting Filament ◽  
Atomic Force ◽  
Bipolar Type ◽  
Afm Probe

In thin ZrO2 (Y) / Ni films, with used of an atomic force microscope (AFM) probe, conductive ferromagnetic filaments of nanometer sizes, consisting of Ni atoms, are formed. Memristor structures based on such films, the upper electrode of which was the AFM probe, demonstrated bipolar-type resistive switching (RP) associated with the destruction and reduction of Ni filaments. The area where the conducting filament emerges on the surface of the ZrO2 (Y) film manifested itself in the magnetic force image as a single-domain ferromagnetic particle.

scholarly journals Bipolar resistive switching on TiO2/Au by conducting Atomic Force Microscopy

2019 ◽  
Vol 14 ◽  
pp. 100-103
Author(s):  
M. Linares Moreau ◽  
M. Barella ◽  
L. López Mir ◽  
N. Ghenzi ◽  
F. Golmar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Resistive Switching ◽  
Bipolar Resistive Switching ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Демонстрация эффекта резистивного переключения отдельных филаментов в мемристорных структурах Ag/Ge/Si методом атомно-силовой микроскопии

2021 ◽  
Vol 47 (15) ◽  
pp. 23
Author(s):  
В.А. Воронцов ◽  
Д.А. Антонов ◽  
A.В. Круглов ◽  
И.Н. Антонов ◽  
В.E. Koтомина ◽  
...  
Keyword(s):  
Resistive Switching ◽  
Hysteresis Loops ◽  
Dislocation Core ◽  
Conductive Atomic Force Microscopy ◽  
Bipolar Resistive Switching ◽  
Force Microscopy ◽  
Ion Drift ◽  
Atomic Force ◽  
Current Voltage ◽  
Ag Filament

Resistive switching effect of separate dislocations in Ag/Ge/Si(001) memristor structures was demonstrated experimentally by Conductive Atomic Force Microscopy. Hysteresis loops typical for bipolar resistive switching were observed in the current-voltage curves of the dislocations due to formation and rapture of Ag filament in the Ge layer as a result of Ag+ ion drift along the dislocation core.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

Sign in / Sign up

Export Citation Format

Share Document