scholarly journals Density of defect states retrieved from the hysteretic gate transfer characteristics of monolayer MoS2 field effect transistors

AIP Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 015230 ◽  
Author(s):  
Qiang Xu ◽  
Yingri Sun ◽  
Peng Yang ◽  
Yaping Dan

Sensors ◽  
2017 ◽  
Vol 17 (7) ◽  
pp. 1640 ◽  
Author(s):  
Alex Tseng ◽  
David Lynall ◽  
Igor Savelyev ◽  
Marina Blumin ◽  
Shiliang Wang ◽  
...  


Author(s):  
Steffen Rühl ◽  
Max Heyl ◽  
Fabian Gärisch ◽  
Sylke Blumstengel ◽  
Giovanni Ligorio ◽  
...  


2013 ◽  
Vol 25 (15) ◽  
pp. 155303 ◽  
Author(s):  
A Di Bartolomeo ◽  
F Giubileo ◽  
L Iemmo ◽  
F Romeo ◽  
S Santandrea ◽  
...  




2020 ◽  
Vol 20 (2) ◽  
pp. 298-303
Author(s):  
Yuhang Wang ◽  
Dongyong Li ◽  
Xubo Lai ◽  
Boyang Liu ◽  
Yibao Chen ◽  
...  




2018 ◽  
Vol 20 (11) ◽  
pp. 643-650
Author(s):  
I.I. Abramov ◽  
◽  
N.V. Kolomejtseva ◽  
V.A. Labunov ◽  
I.A. Romanova ◽  
...  


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