Density of defect states retrieved from the hysteretic gate transfer characteristics of monolayer MoS2 field effect transistors
2013 ◽
Vol 25
(15)
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pp. 155303
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2019 ◽
Vol 481
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pp. 910-918
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2018 ◽
Vol 18
(11)
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pp. 1415-1421
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2011 ◽
Vol 11
(3)
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pp. S381-S384
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