scholarly journals Environmental chamber with controlled temperature and relative humidity for ice crystallization kinetic measurements by atomic force microscopy

2020 ◽  
Vol 91 (2) ◽  
pp. 023704 ◽  
Author(s):  
Melisa M. Gianetti ◽  
Julián Gelman Constantin ◽  
Horacio R. Corti ◽  
M. Paula Longinotti
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Crystallization Kinetic ◽  
Kinetic Measurements ◽  
Environmental Chamber ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ice Crystallization

scholarly journals Atomic force microscopy reveals how relative humidity impacts the Young’s modulus of lignocellulosic polymers and their adhesion with cellulose nanocrystals at the nanoscale

2020 ◽  
Vol 147 ◽  
pp. 1064-1075 ◽  
Author(s):  
Carlos Marcuello ◽  
Laurence Foulon ◽  
Brigitte Chabbert ◽  
Veronique Aguié-Béghin ◽  
Michael Molinari
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Young’S Modulus ◽  
Cellulose Nanocrystals ◽  
Young's Modulus ◽  
Force Microscopy ◽  
Atomic Force

Recovery dynamics of acrylic coating surfaces under elevated relative humidity monitored by atomic force microscopy

2020 ◽  
Vol 146 ◽  
pp. 105712
Author(s):  
Qi Chen ◽  
Mingwen Tian ◽  
Kristel de Vos ◽  
Maud Kastelijn ◽  
Ron A.H. Peters ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Force Microscopy ◽  
Acrylic Coating ◽  
Atomic Force ◽  
Recovery Dynamics

Direct observations of mineral fluid reactions using atomic force microscopy: the specific example of calcite

2012 ◽  
Vol 76 (1) ◽  
pp. 227-253 ◽  
Author(s):  
E. Ruiz -Agudo ◽  
C. V. Putnis
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Physical Parameters ◽  
Extensive Literature ◽  
Mineral Surfaces ◽  
Kinetic Measurements ◽  
Force Microscopy ◽  
Crystal Dissolution ◽  
Direct Observations ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) enables in situ observations of mineral fluid reactions to be made at a nanoscale. During the past 20 years, the direct observation of mineral surfaces at molecular resolution during dissolution and growth has made significant contributions toward improvements in our understanding of the dynamics of mineral fluid reactions at the atomic scale. Observations and kinetic measurements of dissolution and growth from AFM experiments give valuable evidence for crystal dissolution and growth mechanisms, either confirming existing models or revealing their limitations. Modifications to theories can be made in the light of experimental evidence generated by AFM. Significant changes in the kinetics and mechanisms of crystallization and dissolution processes occur when the chemical and physical parameters of solutions, including the presence of impurity molecules or background electrolytes, are altered. Calcite has received considerable attention in AFM studies due to its central role in geochemical and biomineralization processes. This review summarizes the extensive literature on the dissolution and growth of calcite that has been generated by AFM studies, including the influence of fluid characteristics such as supersaturation, solution stoichiometry, pH, temperature and the presence of impurities.

Effect of Wettability on Adhesion Force between Silica Particles Evaluated by Atomic Force Microscopy Measurement as a Function of Relative Humidity

Langmuir ◽  
1999 ◽  
Vol 15 (13) ◽  
pp. 4584-4589 ◽  
Author(s):  
Masayoshi Fuji ◽  
Kotoe Machida ◽  
Takashi Takei ◽  
Tohru Watanabe ◽  
Masatoshi Chikazawa
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Adhesion Force ◽  
Silica Particles ◽  
Atomic Force Microscopy Measurement ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Measurement

scholarly journals Adhesion of Polysilicon Microbeams in Controlled Humidity Ambients

1998 ◽  
Vol 518 ◽  
Author(s):  
M. P. de Boer ◽  
P. J. Clews ◽  
B. K. Smith ◽  
T. A. Michalske
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Oxygen Plasma ◽  
Rough Interface ◽  
Force Microscopy ◽  
Smooth Interface ◽  
Atomic Force ◽  
Adhesion Measurement ◽  
Exponential Trend

AbstractWe characterize in-situ the adhesion of surface micromachined polysilicon beams subject to controlled humidity ambients. Beams were freed by supercritical CO2drying. Consistent adhesion results were obtained using a post-treatment in an oxygen plasma which rendered the microbeams uniformly hydrophilic. Individual beam deformations were measured by optical interferometry after equilibration at a given relative humidity (RH). Validation of each adhesion measurement was accomplished by comparing the deformations with elasticity theory. The data indicates that adhesion increases exponentially with RH from 30% to 95%, with values from 1 mJ/m2 to 50 mJ/m2. Using the Kelvin equation, we show that the data should be independent of RH if a smooth interface is considered. By modeling a rough interface consistent with atomic force microscopy (AFM) data, the exponential trend is satisfactorily explained.

Reversible uptake of water on NaCl nanoparticles at relative humidity below deliquescence point observed by noncontact environmental atomic force microscopy

2011 ◽  
Vol 134 (4) ◽  
pp. 044702 ◽  
Author(s):  
Derek A. Bruzewicz ◽  
Antonio Checco ◽  
Benjamin M. Ocko ◽  
Ernie R. Lewis ◽  
Robert L. McGraw ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Force Microscopy ◽  
Atomic Force

Fabrication of SiNWs-FET Nanostructure Via Atomic Force Microscopy Lithography

2020 ◽  
Vol 301 ◽  
pp. 103-110
Author(s):  
Nurain Najihah Alias ◽  
Khatijah Aisha Yaacob ◽  
Kuan Yew Cheong
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Silicon Nanowires ◽  
Silicon Oxide ◽  
Silicon Layer ◽  
Silicon On Insulator ◽  
Force Microscopy ◽  
Atomic Force ◽  
Effect Transistor ◽  
P Type

The unique electrical properties of silicon nanowires (SiNWs) is one of the reasons it become an attractive transducer for biosensor nowadays. Positive (holes) and negative (electron) charge carriers from SiNWs can simply interact with either positive or negative charge of sensing target. In this paper, we have studied the fabrication of silicon nanowires field effect transistor (SiNWs-FET) nanostructure patterned on 15 Ω resistivity of p-type silicon on insulator (SOI) wafer fabricated via atomic force microscopy lithography technique. To fabricate SiNWs-FET nanostructure, a conductive AFM tip, Cr/Pt cantilever tip, was used then various value of applied voltage, writing speed and relative humidity were studied. Subsequent, followed by wet etching processes, admixture of tetramethylammonium hydroxide (TMAH) and isopropyl alcohol (IPA) were used to remove the undesired of silicon layer and diluted hydrofluoric acid (HF) was used to remove the oxide layer. From the results, it shows that, cantilever tip at 9 V with 0.4 μm/s writing speed and relative humidity between 55% - 60% gives the best formation of silicon oxide to fabricate SiNWs-FET nanostructure.

Effects of relative humidity and applied force on atomic force microscopy images of the filamentous phage fd

1998 ◽  
Vol 72 (3-4) ◽  
pp. 165-176 ◽  
Author(s):  
Xiaolong Ji ◽  
Jeong Oh ◽  
A Keith Dunker ◽  
K.W Hipps
Keyword(s):  
Atomic Force Microscopy ◽  
Relative Humidity ◽  
Applied Force ◽  
Filamentous Phage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images
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