Observation and characterization of impact ionization-induced OFF-state breakdown in Schottky-type p-GaN gate HEMTs
1989 ◽
Vol 18
(10)
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pp. 927-934
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Keyword(s):
2006 ◽
Vol 3
(6)
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pp. 2299-2302
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Keyword(s):
2006 ◽
Vol 518
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pp. 235-240
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2008 ◽
Vol 6
(1)
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pp. 127-139
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