19—COMPOSITE FREQUENCIES IN YARN-THICKNESS VARIATIONS

1948 ◽  
Vol 39 (7) ◽  
pp. T225-T231 ◽  
Author(s):  
W. Lawrence Balls
Keyword(s):  
Yarn Thickness ◽  
Thickness Variations

Effects of Vibration on the Preparation of Ultrathin Sections

1973 ◽  
Vol 31 ◽  
pp. 358-359
Author(s):  
Joseph M. Blum ◽  
Edward P. Gargiulo ◽  
J. R. Sawers
Keyword(s):  
Cutting Speed ◽  
Ground Level ◽  
Environmental Vibration ◽  
Block Face ◽  
Ultrathin Sections ◽  
Embedding Medium ◽  
Thickness Variations ◽  
Building Walls ◽  
Cutting Direction ◽  
Diamond Knife

It is now well-known that chatter (Figure 1) is caused by vibration between the microtome arm and the diamond knife. It is usually observed as a cyclical variation in “optical” density of an electron micrograph due to sample thickness variations perpendicular to the cutting direction. This vibration might be induced by using too large a block face, too large a clearance angle, excessive cutting speed, non-uniform embedding medium or microtome vibration. Another prominent cause is environmental vibration caused by inadequate building construction. Microtomes should be installed on firm, solid floors. The best floors are thick, ground-level concrete pads poured over a sand bed and isolated from the building walls. Even when these precautions are followed, we recommend an additional isolation pad placed on the top of a sturdy table.

Various technic for the measurement of step thickness on crystal surfaces

1978 ◽  
Vol 36 (1) ◽  
pp. 438-439
Author(s):  
C. Boulesteix ◽  
C. Colliex ◽  
C. Mory ◽  
B. Pardo ◽  
D. Renard
Keyword(s):  
Critical Thickness ◽  
Symmetric Case ◽  
Transmitted Intensity ◽  
Crystal Surfaces ◽  
Bright Field ◽  
Excited Wave ◽  
Highly Sensitive ◽  
Contrast Mechanisms ◽  
Step Thickness ◽  
Thickness Variations

Contrast mechanisms, which are responsible of the various types of image formation, are generally thickness dependant. In the following, two imaging modes in the 100 kV CTEM are described : they are highly sensitive to thickness variations and can be used for quantitative estimations of step heights.Detailed calculations (1) of the bright-field intensity have been carried out in the 3 (or 2N+l)-beam symmetric case. They show that in given conditions, the two important symmetric Bloch waves interfere most strongly at a critical thickness for which they have equal emergent amplitudes (the more excited wave at the entrance surface is also the more absorbed). The transmitted intensity I for a Nd2O3 specimen has been calculated as a function of thickness t. The capacity of the method to detect a step and measure its height can be more clearly deduced from a plot of dl/Idt as shown in fig. 1.

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

The Investigation of Fluorine Induced Novel Probe Marker Discoloration

2018 ◽  
Author(s):  
W.F. Hsieh ◽  
Henry Lin ◽  
Vincent Chen ◽  
Irene Ou ◽  
Y.S. Lou
Keyword(s):  
Electric Field ◽  
Dark Field ◽  
Inspection System ◽  
Automated Inspection ◽  
Stress Tests ◽  
Auger Analysis ◽  
Corrosion Film ◽  
Scan Data ◽  
Thickness Variations ◽  
One Year

Abstract This paper describes the investigation of donut-shaped probe marker discolorations found on Al bondpads. Based on SEM/EDS, TEM/EELS, and Auger analysis, the corrosion product is a combination of aluminum, fluorine, and oxygen, implying that the discolorations are due to the presence of fluorine. Highly accelerated stress tests simulating one year of storage in air resulted in no new or worsening discolorations in the affected chips. In order to identify the exact cause of the fluorine-induced corrosion, the authors developed an automated inspection system that scans an entire wafer, recording and quantifying image contrast and brightness variations associated with discolorations. Dark field TEM images reveal thickness variations of up to 5 nm in the corrosion film, and EELS line scan data show the corresponding compositional distributions. The findings indicate that fluorine-containing gases used in upstream processes leave residues behind that are driven in to the Al bondpads by probe-tip forces and activated by the electric field generated during CP testing. The knowledge acquired has proven helpful in managing the problem.

Regional crustal thickness variations of the Peninsular Ranges, southern California

Geology ◽  
2000 ◽  
Vol 28 (4) ◽  
pp. 303-306
Author(s):  
Jennifer L. Lewis ◽  
Steven M. Day ◽  
Harold Magistrale ◽  
Jennifer Eakins ◽  
Frank Vernon
Keyword(s):  
Southern California ◽  
Crustal Thickness ◽  
Peninsular Ranges ◽  
Thickness Variations

Quantitative Measurement of Fluorescent Layers with Respect to Spatial Thickness Variations and Substrate Properties

2020 ◽  
Vol 74 (4) ◽  
pp. 439-451
Author(s):  
Philipp Holz ◽  
Christoph Pönisch ◽  
Albrecht Brandenburg
Keyword(s):  
Manufacturing Industry ◽  
Quantitative Measurement ◽  
Fluorescence Emission ◽  
Fluorescence Analysis ◽  
Thin Layers ◽  
Fluorescence Signal ◽  
Functional Coatings ◽  
Custom Made ◽  
Substrate Properties ◽  
Thickness Variations

Imaging fluorescence spectroscopy proves to be a fast and sensitive method for measuring the thickness of thin coatings in the manufacturing industry. This encouraged us to systematically study, theoretically and experimentally, parameters that influence the fluorescence of thin layers. We analyzed the fluorescence signal as a function of the scattering and reflectance properties of the sample substrate. In addition, we investigated effects of the layer properties on fluorescence emission. A ray-tracing software is used to describe the influence of these parameters on the fluorescence emission of thin layers. Experiments using a custom-made system for imaging fluorescence analysis verify the simulations. This work shows a factor five variation of fluorescence intensity as a function of the reflectance of the sample substrate. Simulations show variations by a factor of up to eight for samples with different surface roughness. Results on tilted samples indicate a significant increase of the detected fluorescence signal, for fluorescent droplets on reflective substrates, if illuminated and coaxially observed at angles greater than 25°. These findings are of utmost relevance for all applications which utilize the fluorescence emission to quantify thin layers. These applications range from in-line lubricant monitoring in press plants to monitoring of functional coatings in medical technology and the detection of filmic contaminations.

scholarly journals Effects of Microwave Treatment in Immersed Conditions on the Mechanical Properties of Jute Yarn

Fibers ◽  
2021 ◽  
Vol 9 (7) ◽  
pp. 40
Author(s):  
Felicia Syrén ◽  
Joel Peterson ◽  
Nawar Kadi
Keyword(s):  
Mechanical Properties ◽  
Tensile Testing ◽  
Glass Fibers ◽  
Microwave Treatment ◽  
Environmental Benefits ◽  
Treatment Result ◽  
Bast Fiber ◽  
Fiber Properties ◽  
Yarn Thickness ◽  
Jute Yarn

The versatile bast fiber jute has environmental benefits compared to glass fibers. However, for jute to be used in a composite, the fiber properties need to be altered. This study aims to improve the mechanical properties of jute yarn to make it more suitable for technical applications as a composite. To alter its mechanical properties, jute yarn was immersed in water during microwave treatment. The time and power of the microwave settings differed between runs. Two states of the yarn were tested: fastened and un-fastened. Tensile testing was used at the yarn and fiber level, followed by Fourier-transform infrared spectroscopy (FTIR) and microscopy. The treatment result demonstrated the ability to increase the elongation of the jute yarn by 70%. The tenacity was also increased by 34% in the fastened state and 20% in the un-fastened state. FTIR showed that no change in the molecular structure occurred. The treatments resulted in a change of yarn thickness depending on the state of the yarn. The results indicate that microwave treatment can be used to make jute more suitable for technical applications depending on the microwave treatment parameters.

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