Dynamics of negative bias thermal stress-induced threshold voltage shifts in indium zinc oxide transistors: impact of the crystalline structure on the activation energy barrier
2014 ◽
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pp. 165103
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2016 ◽
Vol 63
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pp. 1054-1058
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2010 ◽
Vol 31
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pp. 440-442
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2019 ◽
Vol 116
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pp. 12678-12683
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2008 ◽
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pp. 443-448
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