Lateral Resolution and Signal to Noise Ratio in Electrostatic Force Detection Based on Scanning Probe Microscopy

2012 ◽  
Vol 29 (7) ◽  
pp. 070703 ◽  
Author(s):  
Dong-Dong Zhang ◽  
Xiao-Wei Wang ◽  
Rui Wang ◽  
Sheng-Nan Wang ◽  
Zhi-Hai Cheng ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Signal To Noise Ratio ◽  
Electrostatic Force ◽  
Scanning Probe ◽  
Lateral Resolution ◽  
Signal To Noise ◽  
Force Detection ◽  
Probe Microscopy ◽  
Noise Ratio

scholarly journals Enabling Autonomous Scanning Probe Microscopy Imaging of Single Molecules with Deep Learning

Nanoscale ◽  
2021 ◽  
Author(s):  
Javier Sotres ◽  
Hannah Boyd ◽  
Juan Francisco Gonzalez-Martinez
Keyword(s):  
Deep Learning ◽  
Scanning Probe Microscopy ◽  
Signal To Noise Ratio ◽  
Single Molecules ◽  
Real Space ◽  
Scanning Probe ◽  
Signal To Noise ◽  
Microscopy Imaging ◽  
Probe Microscopy ◽  
The Real

Scanning Probe Microscopies allow investigating surfaces at the nanoscale, in the real space and with unparalleled signal-to-noise ratio. However, these microscopies are not used as much as it would be...

Partially coherent migration

Geophysics ◽  
1993 ◽  
Vol 58 (9) ◽  
pp. 1301-1313 ◽  
Author(s):  
Delman Lee ◽  
Geoffrey M. Jackson ◽  
Iain M. Mason
Keyword(s):  
Signal To Noise Ratio ◽  
Velocity Model ◽  
Lateral Resolution ◽  
Signal To Noise ◽  
Timing Errors ◽  
Macro Model ◽  
Partially Coherent ◽  
Window Width ◽  
Stochastic Framework ◽  
Noise Ratio

Partially coherent migration reduces the spurious details introduced by velocity macro‐model imperfections. In a partially coherent migration, instead of summing coherently over the full aperture to achieve maximum lateral resolution, (1) a coherent stack is performed over a limited window width, and then (2) the collection of coherent stacks for different windows along the full aperture are summed incoherently to produce an amplitude value for each output point. Amplitude accuracy of a migration is improved with some sacrifice in spatial (lateral) resolution. A parameter in partially coherent migration is the running coherent window width, which accounts for the spatial correlation of errors in the velocity model. The coherent window width controls the trade‐off between signal‐to‐noise ratio and lateral resolution. Assuming that timing errors introduced by imperfections of a velocity macro‐model are from a zero‐mean stationary Gaussian process, partially coherent migration is shown to raise the signal‐to‐noise ratio of the migrated image as compared to a conventional migration. The two competing aspects of signal‐to‐noise ratio and lateral resolution of the partially coherent migration in the presence of timing errors are analyzed in a stochastic framework. The intuitively attractive idea of limiting the coherent window width to the correlation length of the timing errors is confirmed numerically.

scholarly journals Optically induced forces in scanning probe microscopy

Nanophotonics ◽  
2014 ◽  
Vol 3 (1-2) ◽  
pp. 105-116 ◽  
Author(s):  
Dana C. Kohlgraf-Owens ◽  
Sergey Sukhov ◽  
Léo Greusard ◽  
Yannick De Wilde ◽  
Aristide Dogariu
Keyword(s):  
Scanning Probe Microscopy ◽  
Near Field ◽  
Broad Band ◽  
Optical Force ◽  
Scanning Probe ◽  
Force Detection ◽  
Probe Microscopy ◽  
Practical Applications ◽  
Single Detector ◽  
Optically Induced

AbstractTypical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of background propagating radiation, the relatively narrowband operation of photodetectors which complicates the operation over a wide wavelength range, and the difficulty in detecting radiation in the far-IR and THz. Here we review an alternative near-field light measurement technique based on the detection of optically induced forces acting on the scanning probe. This type of detection overcomes some of the above limitations, permitting true broad-band detection of light directly in the near-field with a single detector. The physical origins and the main characteristics of optical force detection are reviewed. In addition, intrinsic effects of the inherent optical forces for certain operation modalities of scanning probe microscopy are discussed. Finally, we review practical applications of optical force detection of interest for the broader field of the scanning probe microscopy.

scholarly journals Carbon nanotube tip probes: stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors

2001 ◽  
Vol 12 (3) ◽  
pp. 363-367 ◽  
Author(s):  
Cattien V Nguyen ◽  
Kuo-Jen Chao ◽  
Ramsey M D Stevens ◽  
Lance Delzeit ◽  
Alan Cassell ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Surface Science ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Lateral Resolution ◽  
Probe Microscopy

Characterization of local electric properties of oxide materials using scanning probe microscopy techniques: A review

2018 ◽  
Vol 11 (05) ◽  
pp. 1830002 ◽  
Author(s):  
Wanheng Lu ◽  
Kaiyang Zeng
Keyword(s):  
Metal Oxides ◽  
Scanning Probe Microscopy ◽  
Electrostatic Force ◽  
Functional Materials ◽  
Electric Properties ◽  
Scanning Probe ◽  
Surface Charges ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Force Microscopy

The structure-function relationship at the nanoscale is of great importance for many functional materials, such as metal oxides. To explore this relationship, Scanning Probe Microscopy (SPM)-based techniques are used as powerful and effective methods owing to their capability to investigate the local surface structures and multiple properties of the materials with a high spatial resolution. This paper gives an overview of SPM-based techniques for characterizing the electric properties of metal oxides with potential in the applications of electronics devices. Three types of SPM techniques, including conductive AFM ([Formula: see text]-AFM), Kelvin Probe Force Microscopy (KPFM), and Electrostatic Force Microscopy (EFM), are summarized with focus on their principles and advances in measuring the electronic transport, ionic dynamics, the work functions and the surface charges of oxides.

Determination of the Best Emulsion for the Microscopy of Crystals

1981 ◽  
Vol 39 ◽  
pp. 32-33
Author(s):  
David A. Grano ◽  
Kenneth H. Downing
Keyword(s):  
Spatial Frequency ◽  
Information Transfer ◽  
Signal To Noise Ratio ◽  
Experimental Situation ◽  
Photographic Emulsion ◽  
Modulation Transfer ◽  
Signal To Noise ◽  
Frequency Space ◽  
Noise Ratio

The retrieval of high-resolution information from images of biological crystals depends, in part, on the use of the correct photographic emulsion. We have been investigating the information transfer properties of twelve emulsions with a view toward 1) characterizing the emulsions by a few, measurable quantities, and 2) identifying the “best” emulsion of those we have studied for use in any given experimental situation. Because our interests lie in the examination of crystalline specimens, we've chosen to evaluate an emulsion's signal-to-noise ratio (SNR) as a function of spatial frequency and use this as our critereon for determining the best emulsion.The signal-to-noise ratio in frequency space depends on several factors. First, the signal depends on the speed of the emulsion and its modulation transfer function (MTF). By procedures outlined in, MTF's have been found for all the emulsions tested and can be fit by an analytic expression 1/(1+(S/S0)2). Figure 1 shows the experimental data and fitted curve for an emulsion with a better than average MTF. A single parameter, the spatial frequency at which the transfer falls to 50% (S0), characterizes this curve.

Experiments in Bright-Field Imaging with Hollow-Cone Illumination

1981 ◽  
Vol 39 ◽  
pp. 226-227
Author(s):  
W. Kunath ◽  
K. Weiss ◽  
E. Zeitler
Keyword(s):  
Signal To Noise Ratio ◽  
Carbon Support ◽  
Electronic System ◽  
Optic Axis ◽  
Hollow Cone ◽  
Signal To Noise ◽  
Bright Field ◽  
Noise Ratio ◽  
Single Field ◽  
Field Imaging

Bright-field images taken with axial illumination show spurious high contrast patterns which obscure details smaller than 15 ° Hollow-cone illumination (HCI), however, reduces this disturbing granulation by statistical superposition and thus improves the signal-to-noise ratio. In this presentation we report on experiments aimed at selecting the proper amount of tilt and defocus for improvement of the signal-to-noise ratio by means of direct observation of the electron images on a TV monitor.Hollow-cone illumination is implemented in our microscope (single field condenser objective, Cs = .5 mm) by an electronic system which rotates the tilted beam about the optic axis. At low rates of revolution (one turn per second or so) a circular motion of the usual granulation in the image of a carbon support film can be observed on the TV monitor. The size of the granular structures and the radius of their orbits depend on both the conical tilt and defocus.

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