Effect of total ionizing dose radiation on the 0.25 μm RF PDSOI nMOSFETs with thin gate oxide
2009 ◽
Vol 30
(1)
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pp. 014004
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2002 ◽
Vol 12
(3)
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pp. 57-60
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2000 ◽
Vol 47
(3)
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pp. 650-652
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2006 ◽
Vol 46
(9-11)
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pp. 1657-1663
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2000 ◽
Vol 39
(Part 1, No. 4B)
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pp. 2287-2290
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Keyword(s):
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