scholarly journals Study of Langmuir monolayers and Langmuir-Schaefer films based on symmetrical meso-aryl-substituted porphyrin derivative

2021 ◽  
Vol 2086 (1) ◽  
pp. 012195
Author(s):  
V N Mironyuk ◽  
A J K Al-Alwani ◽  
N N Begletsova ◽  
M V Gavrikov ◽  
A S Kolesnikova ◽  
...  
Keyword(s):  
Experimental Data ◽  
Langmuir Monolayers ◽  
Specific Area ◽  
Compression Modulus ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solid Substrates ◽  
Compression Isotherms ◽  
Transfer Pressure

Abstract This paper presents the results of a study of meso-aryl-substituted porphyrin Langmuir monolayers by the method of compression isotherms. Experimental data were used to plot the dependences of the compression modulus (C−1) on the specific area. Monolayers at specific surface pressure were transferred to solid substrates and investigated. The monolayers were transferred to the surface of monocrystalline silicon at surface pressures of 8, 25, and 60 mN/m and examined them by atomic force microscopy (AFM) in a semi-contact mode. It was found that with an increase in the transfer pressure, the coarsening of molecular aggregates occurs. The smallest roughness is observed for a porphyrin film formed and transferred at a pressure of 8 mN/m.

Atomic Force Microscopy Contact Mode Study on Ultra High Molecular Weight Polyethylene

2005 ◽  
Vol 874 ◽  
Author(s):  
Yifang Cao ◽  
Jikou Zhou ◽  
Oludele Popoola ◽  
Dal F. Swarts ◽  
Wole Soboyejo
Keyword(s):  
Experimental Data ◽  
Molecular Weight ◽  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
High Molecular Weight ◽  
Work Of Adhesion ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ultra High Molecular Weight

AbstractThis paper presents the results of contact mode atomic force microscopy (AFM) study on the nanoscale Young's modulus and work of adhesion of ultra high molecular weight polyethylene (UHMWPE). Cryoultramicrotomed surfaces of UHMWPE were scanned using the contact mode of AFM. Fibril regions are commonly found on the sample, however, a non-fibril particulate region was also found. AFM force displacement curves were obtained for the sample. The JKR theory and Maugis Dugdale model were used for the analysis. A good fitting between the theories and experimental data was found. The nanoscale Young's modulus and work of adhesion of UHMWPE extracted from the experimental data were in reasonably good agreement with the values reported in other literatures.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Contact and non-contact mode imaging by atomic force microscopy

1996 ◽  
Vol 273 (1-2) ◽  
pp. 138-142 ◽  
Author(s):  
Seizo Morita ◽  
Satoru Fujisawa ◽  
Eigo Kishi ◽  
Masahiro Ohta ◽  
Hitoshi Ueyama ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

Conducting Polymer nanoComposites (CPC): Nanocharacterisation of layer by layer sprayed PMMA-CNT vapour sensors by Atomic force Microscopy in current Sensing Mode (CS-AFM)

2008 ◽  
Vol 1143 ◽  
Author(s):  
Bijandra Kumar ◽  
Mickaël Castro ◽  
Jianbo Lu ◽  
Jean-François Feller
Keyword(s):  
Atomic Force Microscopy ◽  
Spray Deposition ◽  
Dynamic Mode ◽  
Layer By Layer ◽  
Initial State ◽  
Contact Mode ◽  
Current Sensing ◽  
Multi Wall Carbon Nanotubes ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTOrganic vapour sensors based on poly (methylmethacrylate)-multi-wall carbon nanotubes (PMMA-CNT) conductive polymer nanocomposite (CPC) were developed via layer by layer technique by spray deposition. CPC Sensors were exposed to three different classes of solvents (chloroform, methanol and water) and their chemo-electrical properties were followed as a function of CNTcontent in dynamic mode. Detection time was found to be shorter than that necessary for full recovery of initial state. CNT real three dimensional network has been visualized by Atomic force microscopy in a field assisted intermittent contact mode. More interestingly real conductive network system and electrical ability of CPC have been explored by current-sensing atomic force microscopy (CS-AFM). Realistic effect of voltage on electrical conductivity has been found linear.

scholarly journals Scanning speed phenomenon in contact-resonance atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 945-952 ◽  
Author(s):  
Christopher C Glover ◽  
Jason P Killgore ◽  
Ryan C Tung
Keyword(s):  
Atomic Force Microscopy ◽  
Hydrodynamic Theory ◽  
Squeeze Film ◽  
Resonance Spectroscopy ◽  
Related Phenomenon ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scan Speed ◽  
Contact Resonance

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.

scholarly journals Contact-Mode High-Resolution High-Speed Atomic Force Microscopy Movies of the Purple Membrane

2009 ◽  
Vol 97 (5) ◽  
pp. 1354-1361 ◽  
Author(s):  
Ignacio Casuso ◽  
Noriyuki Kodera ◽  
Christian Le Grimellec ◽  
Toshio Ando ◽  
Simon Scheuring
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
High Speed ◽  
Purple Membrane ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force
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