scholarly journals X-ray spectroscopic diagnosis of laser-produced plasmas, with emphasis on line broadening

1980 ◽  
Vol 22 (6) ◽  
pp. 2746-2760 ◽  
Author(s):  
J. D. Kilkenny ◽  
R. W. Lee ◽  
M. H. Key ◽  
J. G. Lunney
Keyword(s):  
Line Broadening ◽  
X Ray ◽  
On Line

Flat Crystal X-Ray Optics

1957 ◽  
Vol 1 ◽  
pp. 193-206 ◽  
Author(s):  
William J. Campbell ◽  
Melvin Leon ◽  
John Thatcher
Keyword(s):  
Wave Length ◽  
Pulse Height ◽  
Line Profiles ◽  
Line Broadening ◽  
Crystal Surfaces ◽  
X Ray ◽  
Line Intensities ◽  
Long Wave ◽  
On Line ◽  
College Park

AbstractAn investigation was undertaken by the Bureau of Mines at College Park, Md., to determine the effect of various combinations of collimators, analyzing crystals and detectors on line intensities, line-to-backgrouhd ratios, and spectral resolution. The research showed that line broadening due to mosaic crystal surfaces was greatly reduced and line splitting from faults was eliminatedby the use of two fine collimators (0.005 inch, spacing, 4 inch length). Line intensities were reduced, but lineto- background ratios arid line profiles were substantially improved with double collimators. Pulse height discrimination resulted in marked improvement in the line-to-background ratio in the long-wave length region, 2 to 10 A, but was much less effective for shorter wave lengths.

Evaluation of Straight and Curved Braun Position-Sensitive Proportional Counters on a Huber-Guinier X-Ray Diffraction System

1983 ◽  
Vol 27 ◽  
pp. 261-266 ◽  
Author(s):  
R.A. Newman ◽  
P. Moore Kirchhoff ◽  
T.G. Fawcett
Keyword(s):  
Scintillation Counter ◽  
Line Profiles ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Camera System ◽  
X Ray ◽  
Proportional Counters ◽  
On Line ◽  
Position Sensitive ◽  
Gas Chamber

AbstractThe interfacing of both straight and curved Braun Position- Sensitive Proportional Counters (PSPC's) to a high resolution Huber-Guinier camera system has been accomplished, resulting in a 10 to 100-fold decrease in data collection times when compared to conventional Guinier (film or scintillation counter) detector techniques.Various factors causing line broadening were evaluated for both PSPC Guinier systems. The depth of the PSPC gas chamber was found to Have the greatest influence on line profiles. An R0% increase in peak half-widths was observed for PSPC-Guinier data compared to our highest resolution Guinier film data, but still yielded significantly better resolution than conventional powder diffractometer data obtained in our laboratory.

A Retrieval System for a Library of Pathology Reports, Slides and Kodachromes

1972 ◽  
Vol 11 (03) ◽  
pp. 152-162 ◽  
Author(s):  
P. GAYNON ◽  
R. L. WONG
Keyword(s):  
Medical Records ◽  
Operative Procedure ◽  
Clinical Findings ◽  
Free Text ◽  
X Ray ◽  
Inverted File ◽  
Natural Language Parsing ◽  
On Line ◽  
Pathology Reports ◽  
Frequency Counts

With the objective of providing easier access to pathology specimens, slides and kodachromes with linkage to x-ray and the remainder of the patient’s medical records, an automated natural language parsing routine, based on dictionary look-up, was written for Surgical Pathology document-pairs, each consisting of a Request for Examination (authored by clinicians) and its corresponding report (authored by pathologists). These documents were input to the system in free-text English without manual editing or coding.Two types of indices were prepared. The first was an »inverted« file, available for on-line retrieval, for display of the content of the document-pairs, frequency counts of cases or listing of cases in table format. Retrievable items are patient’s and specimen’s identification data, date of operation, name of clinician and pathologist, etc. The English content of the operative procedure, clinical findings and pathologic diagnoses can be retrieved through logical combination of key words. The second type of index was a catalog. Three catalog files — »operation«, »clinical«, and »pathology« — were prepared by alphabetization of lines formed by the rotation of phrases, headed by keywords. These keywords were automatically selected and standardized by the parsing routine and the phrases were extracted from each sentence of each input document. Over 2,500 document-pairs have been entered and are currently being utilized for purpose of medical education.

Nondestructive Inspection of Thin, Low-Z Samples using Multiplexed Compton Scatter Tomography

1997 ◽  
Vol 503 ◽  
Author(s):  
B. L. Evans ◽  
J. B. Martin ◽  
L. W. Burggraf
Keyword(s):  
Signal To Noise Ratio ◽  
Reconstruction Algorithm ◽  
Filtered Backprojection ◽  
Line Broadening ◽  
Compton Scatter ◽  
X Ray ◽  
Tomography System ◽  
Transmission Computed Tomography ◽  
High Purity Germanium ◽  
Scattered Energy

ABSTRACTThe viability of a Compton scattering tomography system for nondestructively inspecting thin, low Z samples for corrosion is examined. This technique differs from conventional x-ray backscatter NDI because it does not rely on narrow collimation of source and detectors to examine small volumes in the sample. Instead, photons of a single energy are backscattered from the sample and their scattered energy spectra are measured at multiple detector locations, and these spectra are then used to reconstruct an image of the object. This multiplexed Compton scatter tomography technique interrogates multiple volume elements simultaneously. Thin samples less than 1 cm thick and made of low Z materials are best imaged with gamma rays at or below 100 keV energy. At this energy, Compton line broadening becomes an important resolution limitation. An analytical model has been developed to simulate the signals collected in a demonstration system consisting of an array of planar high-purity germanium detectors. A technique for deconvolving the effects of Compton broadening and detector energy resolution from signals with additive noise is also presented. A filtered backprojection image reconstruction algorithm with similarities to that used in conventional transmission computed tomography is developed. A simulation of a 360–degree inspection gives distortion-free results. In a simulation of a single-sided inspection, a 5 mm × 5 mm corrosion flaw with 50% density is readily identified in 1-cm thick aluminum phantom when the signal to noise ratio in the data exceeds 28.

Temperature-induced structural phase transitions in RERhSn (RE = Y, Gd-Tm, Lu)

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Simon Engelbert ◽  
Rolf-Dieter Hoffmann ◽  
Jutta Kösters ◽  
Steffen Klenner ◽  
Rainer Pöttgen
Keyword(s):  
Rare Earth ◽  
Phase Transitions ◽  
Driving Force ◽  
Room Temperature ◽  
Structural Phase ◽  
Structural Phase Transitions ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray

Abstract The structures of the equiatomic stannides RERhSn with the smaller rare earth elements Y, Gd-Tm and Lu were reinvestigated on the basis of temperature-dependent single crystal X-ray diffraction data. GdRhSn crystallizes with the aristotype ZrNiAl at 293 and 90 K. For RE = Y, Tb, Ho and Er the HP-CeRuSn type (approximant with space group R3m) is already formed at room temperature, while DyRhSn adopts the HP-CeRuSn type below 280 K. TmRhSn and LuRhSn show incommensurate modulated variants with superspace groups P31m(1/3; 1/3; γ) 000 (No. 157.1.23.1) (γ = 3/8 for TmRhSn and γ = 2/5 for LuRhSn). The driving force for superstructure formation (modulation) is a strengthening of Rh–Sn bonding. The modulation is expressed in a 119Sn Mössbauer spectrum of DyRhSn at 78 K through line broadening.

X-Ray Diffraction Study of Hep Metals. I. Line Broadening in Polycrystalline Cd Powder

1974 ◽  
Vol 29 (12) ◽  
pp. 1771-1777 ◽  
Author(s):  
N. C. Haider ◽  
S. H. Hunter
Keyword(s):  
Room Temperature ◽  
Small Deformation ◽  
Correction Factors ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
Fault Probability ◽  
Large Particle Size ◽  
X Ray ◽  
Melting Temperatures ◽  
Diffraction Patterns

Powder Cd of 99.999% purity was prepared at room temperature (25 °C) and x-ray diffraction patterns were obtained using CuKaα radiation with Ni-filter. The line broadening was analyzed after incorporating the appropriate correction factors. At room temperature Cd was found to have large particle size (653 A), small root mean square strain (.001), small deformation fault probability a (.003). and negligible growth fault probability β(0). Compared to other hep metals which have been studied earlier and which have higher melting temperatures, metal Cd is much less affected by mechanical deformation at room temperature.

Investigation of Residual Strains of the Second Kind in Plastically Deformed Metallic Materials

1994 ◽  
Vol 376 ◽  
Author(s):  
M. Vrána ◽  
P. Klimanek ◽  
T. Kschidock ◽  
P. Lukáš ◽  
P. Mikula
Keyword(s):  
High Resolution ◽  
Neutron Diffraction ◽  
Stacking Faults ◽  
Metallic Materials ◽  
Line Broadening ◽  
X Ray Diffraction ◽  
X Ray ◽  
Neutron Diffractometer ◽  
Residual Strains ◽  
Good Agreement

ABSTRACTInvestigation of strongly distorted crystal structures caused by dislocations, stacking-faults etc. in both plastically deformed f.c.c. and b.c.c. metallic materials was performed by the analysis of the neutron diffraction line broadening. Measurements were realized by means of the high resolution triple-axis neutron diffractometer equipped by bent Si perfect crystals as monochromator and analyzer at the NPI Řež. The substructure parameters obtained in this manner are in good agreement with the results of X-ray diffraction analysis.

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