Interface Repulsion and Lamellar Structures in Thin Films of Homopolymer Blends due to Thermal Oscillations

For P(S-b-MMA)/PS mixtures with ϕPS = 64%, PL exists in thin films annealed at 230–270 °C. For thick films, thermal annealing at 245–270 °C produces both PL and DG of various fractions. PL becomes the only discernible phase in thick films annealed at 230 °C.

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Phase Behavior of Symmetric Ternary Block Copolymer-Homopolymer Blends in Thin Films and on Chemically Patterned Surfaces

Physical Review Letters ◽

10.1103/physrevlett.97.147802 ◽

2006 ◽

Vol 97 (14) ◽

Cited By ~ 45

Author(s):

Mark P. Stoykovich ◽

Erik W. Edwards ◽

Harun H. Solak ◽

Paul F. Nealey

Keyword(s):

Thin Films ◽

Block Copolymer ◽

Phase Behavior ◽

Patterned Surfaces ◽

Homopolymer Blends ◽

Chemically Patterned Surfaces

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Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering

Journal of Applied Crystallography ◽

10.1107/s0021889807009041 ◽

2007 ◽

Vol 40 (3) ◽

pp. 476-488 ◽

Cited By ~ 31

Author(s):

Jinhwan Yoon ◽

Kyeong Sik Jin ◽

Hyun Chul Kim ◽

Gahee Kim ◽

Kyuyoung Heo ◽

...

Keyword(s):

Thin Films ◽

Quantitative Analysis ◽

Volume Fraction ◽

Grazing Incidence ◽

Distortion Factor ◽

X Ray ◽

Lamellar Structures ◽

X Ray Scattering ◽

Brush Polymer ◽

Ray Scattering

In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for lamellar structures formed in thin films supported on substrates, and a comprehensive numerical analysis was performed using the scattering formula. A quantitative analysis was conducted of lamellar structures formed in nanometre-scaled thin films of a brush polymer, poly[oxy(n-decylthiomethylenyl)ethylene], supported on silicon substrates, by GIXS measurements during cooling and subsequent heating, and data analysis was performed using the scattering formula. This analysis provided details (long period, sub-layers and their thicknesses, volume fraction, bristle paracrystal distortion factor, and orientation) of the lamellar structure with varying temperature that are not easily obtained using conventional techniques. Moreover, a molecular structure model and electron density profiles were established.

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Electrodeposition of Bi-Te Thin Films on Silicon Wafer and Micro-Column Arrays on Microporous Glass Template

Nanomaterials ◽

10.3390/nano10030431 ◽

2020 ◽

Vol 10 (3) ◽

pp. 431

Author(s):

Ning Su ◽

Shuai Guo ◽

Fu Li ◽

Bo Li

Keyword(s):

Thin Films ◽

Room Temperature ◽

Deposition Potential ◽

Lamellar Structures ◽

Aspect Ratios ◽

Deposition Density ◽

Microporous Glass ◽

High Insulation ◽

Improved Performance ◽

Large Clusters

Electrodeposition is an important method for preparing bismuth telluride (Bi2Te3)-based thermoelectric (TE) thin films and micro-column arrays. When the concentrations of Bi:Te in electrolytes were 3 mM:4 mM, the TE films satisfied the Bi2Te3 stoichiometry and had no dependence on deposition potential. With increasing over-potential, crystal grains changed from lamellar structures with uniform growth directions to large clusters with staggered dendrites, causing a decrease in the deposition density. Meanwhile, the preferred (110) orientation was diminished. The TE film deposited at −35 mV had an optimum conductivity of 2003.6 S/cm and a power factor of 2015.64 μW/mK2 at room temperature due to the (110)-preferred orientation. The electrodeposition of TE micro-columns in the template was recently used to fabricate high-power micro-thermoelectric generators (micro-TEG). Here, microporous glass templates were excellent templates for micro-TEG fabrication because of their low thermal conductivity, high insulation, and easy processing. A three-step pulsed-voltage deposition method was used for the fabrication of micro-columns with large aspect ratios, high filling rates, and high density. The resistance of a single TE micro-column with a 60 μm diameter and a 200 μm height was 6.22 Ω. This work laid the foundation for micro-TEG fabrication and improved performance.

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Solution-grown unidirectionally oriented crystalline thin films of a U-shaped thienoacene-based semiconductor for high-performance organic field-effect transistors

Journal of Materials Chemistry C ◽

10.1039/c7tc01836c ◽

2017 ◽

Vol 5 (24) ◽

pp. 5872-5876 ◽

Cited By ~ 13

Author(s):

Tatsuya Mori ◽

Tatsuya Oyama ◽

Hideaki Komiyama ◽

Takuma Yasuda

Keyword(s):

Thin Film ◽

Thin Films ◽

Charge Transport ◽

Transport Properties ◽

Field Effect ◽

High Performance ◽

Field Effect Transistors ◽

Organic Transistors ◽

Organic Field Effect Transistors ◽

Lamellar Structures

Strategically dialkylated bis(benzo[4,5]thieno)[2,3-b:3′,2′-d]thiophene molecules having an overall U-shaped configuration can self-organize into bilayer lamellar structures, demonstrating high charge-transport properties in thin-film organic transistors.

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