Texture and microstructure imaging in six dimensions with high-energy synchrotron radiation

The texture of a material can be calculated from several pole figures, which, in turn, are usually measured by one of several `step-scan' techniques. In these techniques, the finite step width limits the attainable orientation resolving power. In the present paper, the discontinuous step-scan technique is replaced by a continuous `sweeping' technique based on the continuous movement of an area detector during exposure. In this way, continuous two-dimensional `images' of pole figures are obtained, without the necessity of interpolation. Similar sweeping techniques are also being used to obtain continuous images of other sections and projections of the six-dimensional `orientation–location' space which characterizes a polycrystalline structure completely. The high potential orientation and/or location resolving power of these imaging techniques can only be reached with synchrotron radiation. In the present paper, the measurements were made at the high-energy (short-wavelength) beamline BW5 at HASYLAB/DESY in Hamburg. The high orientation and location resolving power implies the necessity to distinguish `grain-resolved' textures and microstructures (mainly in recrystallized materials) from `continuous' ones (mainly in deformed materials). Under certain conditions, it is thus possible to obtain the complete six-dimensional `orientation stereology' of grain-resolved microstructures. The new methods are illustrated with several examples, including technological applications.

Download Full-text

Torsion Texture Measurements With High-Energy Synchrotron Radiation on NiAl

Textures and Microstructures ◽

10.1080/07303300310001628733 ◽

2003 ◽

Vol 35 (3-4) ◽

pp. 163-173 ◽

Cited By ~ 20

Author(s):

W. Skrotzki ◽

B. Klöden ◽

R. Tamm ◽

C.-G. Oertel ◽

U. Garbe ◽

...

Keyword(s):

Synchrotron Radiation ◽

High Pressure Torsion ◽

Shear Plane ◽

High Energy ◽

Electron Back Scatter Diffraction ◽

Large Strains ◽

Shear Direction ◽

Texture Formation ◽

Local Texture ◽

Pole Figures

Diffraction with high-energy synchrotron radiation is a new experimental method to determine textures of materials, which due to the special properties of this radiation, in the future may have advantages in terms of accuracy of local texture measurements in comparison to established methods like Electron back scatter diffraction (EBSD). In the present study NiAl polycrystals with two different initial textures have been deformed in torsion at 727°C and 1000°C and their texture development has been measured with highenergy synchrotron radiation. Torsion enables the study of texture formation with strain as well as the exploration of large strains without changing the shape of the samples. The pole figures indicate the preferred alignment of ‹100› with the shear direction and {110} with the shear plane. High pressure torsion may also open new possibilities in terms of grain refinement and texture formation and thus ductilization of NiAl.

Download Full-text

High-resolution XRD and imaging polycrystalline microstructures by moving area detector with high-energy synchrotron radiation

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767304095352 ◽

2004 ◽

Vol 60 (a1) ◽

pp. s234-s234

Author(s):

L. Wcislak ◽

H. J. Bunge ◽

H. Klein ◽

U. Garbe ◽

J. R. Schneider

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

High Energy ◽

Area Detector

Download Full-text

Improvement of spectrometer energy resolution for high-resolution photoelectron spectroscopy

Journal of Synchrotron Radiation ◽

10.1107/s0909049597019262 ◽

1998 ◽

Vol 5 (3) ◽

pp. 1020-1022 ◽

Cited By ~ 7

Author(s):

H. Iwai ◽

H. Namba ◽

Y. Kido ◽

M. Taguchi ◽

R. Oiwa

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

Kinetic Energy ◽

Energy Resolution ◽

Photoelectron Spectroscopy ◽

High Energy ◽

Resolving Power ◽

High Energy Resolution ◽

Operation Conditions ◽

Optimized Conditions

For high-energy-resolution photoelectron spectroscopy using synchrotron radiation, the energy resolution of a commercial compact photoelectron spectrometer (hemispherical concentric spectrometer) was improved by reducing the size of the entrance and detector slits and optimizing the operation conditions of the lens voltage. Under the optimized conditions, ray-tracing simulations show that severe spectral intensity decreases can be avoided. An energy resolution of 6.2 meV and a resolving power of 8100 at a kinetic energy of 50 eV were experimentally obtained.

Download Full-text

Measurement of High-Resolution Recrystallization Textures in Nickel Sheets Using High-Energy Synchrotron Radiation

Materials Science Forum ◽

10.4028/www.scientific.net/msf.495-497.137 ◽

2005 ◽

Vol 495-497 ◽

pp. 137-142 ◽

Cited By ~ 2

Author(s):

Helmut Klein ◽

Andrea Preusser ◽

Lars Raue ◽

Hans Joachim Bunge

Keyword(s):

Heat Treatment ◽

High Resolution ◽

Synchrotron Radiation ◽

High Energy ◽

Recrystallization Process ◽

New Methods ◽

Cold Rolled

The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for omprehensive recrystallization theories.

Download Full-text

Application of high-energy synchrotron radiation for texture studies

Journal of Applied Crystallography ◽

10.1107/s0021889899016684 ◽

2000 ◽

Vol 33 (2) ◽

pp. 364-371 ◽

Cited By ~ 15

Author(s):

O. V. Mishin ◽

E. M. Lauridsen ◽

N. C. Krieger Lassen ◽

G. Brückner ◽

T. Tschentscher ◽

...

Keyword(s):

Synchrotron Radiation ◽

Plate Thickness ◽

High Energy ◽

X Ray Diffraction ◽

Good Qualitative Agreement ◽

Shear Texture ◽

X Ray ◽

Number Of Layers ◽

Pole Figures ◽

Cold Rolled

A novel experimental technique that employs high-energy synchrotron radiation is used for the investigation of through-thickness texture gradients in two aluminium plates, cold-rolled 40% with either intermediate or small draughts. In these two plates, crystallographic textures are inspected in a large number of layers. Texture maps of pole densities throughout the sample thickness are presented. A texture of the rolling type is developed through the plate thickness after intermediate draught rolling. Pronounced inhomogeneities associated with the shear texture are observed in the sample rolled with small draughts. For selected layers, direct pole figures are compared with those obtained by traditional low-energy X-ray diffraction and by the electron backscattering pattern technique using a scanning electron microscope. A good qualitative agreement between textures measured using the three different techniques is obtained. Experimental aspects and potentials of the new technique are discussed.

Download Full-text

Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

Journal of Synchrotron Radiation ◽

10.1107/s1600577518003004 ◽

2018 ◽

Vol 25 (3) ◽

pp. 706-716 ◽

Cited By ~ 5

Author(s):

H. Joress ◽

J. D. Brock ◽

A. R. Woll

Keyword(s):

Synchrotron Radiation ◽

Film Growth ◽

Sample Surface ◽

High Energy ◽

Time Resolved ◽

Synchrotron Source ◽

X Ray ◽

Area Detector ◽

Monochromatic Synchrotron

A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to thein situobservation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan of radiation, incident onto a sample surface, and an area detector to simultaneously collect the XRR signal over an angular range matching that of the incident fan. Factors determining the range and instrumental resolution of the technique in reciprocal space, in addition to the signal-to-background ratio, are described in detail. This particular implementation records ∼5° in 2θ and resolves Kiessig fringes from samples with layer thicknesses ranging from 3 to 76 nm. The value of this approach is illustrated by showingin situXRR data obtained with 100 ms time resolution during the growth of epitaxial La0.7Sr0.3MnO3on SrTiO3by pulsed laser deposition at the Cornell High Energy Synchrotron Source (CHESS). Compared with prior methods for parallel XRR data collection, this is the first method that is both sample-independent and compatible with the highly collimated, monochromatic radiation typical of third-generation synchrotron sources. Further, this technique can be readily adapted for use with laboratory-based sources.

Download Full-text

Texture and microstructure analysis with high-energy synchrotron radiation

Powder Diffraction ◽

10.1154/1.1649317 ◽

2004 ◽

Vol 19 (1) ◽

pp. 60-64 ◽

Cited By ~ 1

Author(s):

Hans J. Bunge

Keyword(s):

Synchrotron Radiation ◽

Orientation Distribution ◽

High Energy ◽

Polycrystalline Materials ◽

Area Detector ◽

High Penetration ◽

High Lateral Resolution ◽

Individual Grains ◽

Relationship Of ◽

Very High

Diffraction of high-energy synchrotron radiation with wavelengths in the range of 0.1 Å, provided by the beamline BW5 at HASYLAB in Hamburg, was used to measure textures (orientation distribution) and microstructures (spatial distribution) of the crystallites in various polycrystalline materials. In order to achieve extremely high angular-combined with very high lateral resolution a continuous sweeping technique with an area detector was employed. This technique “images” three different types of two-dimensional sections and projections of the six-dimensional orientation–location space onto the area detector. In many cases the orientations and locations of all individual grains of the sample can thus be seen simultaneously. The high penetration depth of this radiation in the range of several centimeters (comparable with that of neutrons) allows investigating big or capsulated samples. Examples are given of grain-resolved recrystallization textures, a soldering seam, a filled beverage can, and the orientation distribution of kamacite lamellae in an iron meteorite, elucidating the orientation relationship of the γ→α transformation in iron.

Download Full-text