τompas: a free and integrated tool for online crystallographic analysis in transmission electron microscopy

2020 ◽  
Vol 53 (2) ◽  
pp. 561-568
Author(s):  
Rui-Xun Xie ◽  
Wen-Zheng Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Image Matching ◽  
Software Tool ◽  
Crystallographic Analysis ◽  
Sample Holder ◽  
Transmission Electron ◽  
Pole Figures ◽  
Cross Platform ◽  
Integrated Software

τompas (TEM online multi-purpose analyzing system) is a free and integrated software tool designed to perform online crystallographic analysis in transmission electron microscopy (TEM) experiments. By using sample holder tilt angles as input, τompas can simultaneously simulate pole figures, Kikuchi patterns and feature projections, providing graphical views of the sample crystallography. These simulations are further employed to navigate sample tilting and to quickly interpret experimental Kikuchi patterns and images by image matching, giving self-consistent indices of features and crystal orientations. These functions are integrated with mouse operations to improve work efficiency. τompas is distributed as a small cross-platform program that can be installed on a microscope computer to cooperate with other tools.

A crystallographic analysis of the CoSi/Si(111) interface using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 574-575
Author(s):  
A.C. Daykin ◽  
C.J. Kiely ◽  
R.C. Pond ◽  
J.L. Batstone
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Defect Structure ◽  
Room Temperature ◽  
Theoretical Method ◽  
Crystallographic Analysis ◽  
Si Substrate ◽  
Transmission Electron ◽  
Theoretical Predictions

When CoSi2 is grown onto a Si(111) surface it can form in two distinct orientations. A-type CoSi2 has the same orientation as the Si substrate and B-type is rotated by 180° degrees about the [111] surface normal.One method of producing epitaxial CoSi2 is to deposit Co at room temperature and anneal to 650°C.If greater than 10Å of Co is deposited then both A and B-type CoSi2 form via a number of intermediate silicides .The literature suggests that the co-existence of A and B-type CoSi2 is in some way linked to these intermediate silicides analogous to the NiSi2/Si(111) system. The phase which forms prior to complete CoSi2 formation is CoSi. This paper is a crystallographic analysis of the CoSi2/Si(l11) bicrystal using a theoretical method developed by Pond. Transmission electron microscopy (TEM) has been used to verify the theoretical predictions and to characterise the defect structure at the interface.

Variable Angle TEM Grid Holder for Advanced TEM Lamellae Preparation

2019 ◽  
Author(s):  
Tomáš Hrnčíř ◽  
Marek Šikula ◽  
Pavel Doleže ◽  
Claudio A. G. Savoia
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Sample Holder ◽  
End Point ◽  
Transmission Electron ◽  
End Point Detection ◽  
Point Detection ◽  
User Friendly ◽  
Tem Grid

Abstract Multipurpose sample holder for advanced Transmission Electron Microscopy (TEM) sample preparation which reduces cost of the tool and most importantly simplifies the workflow is introduced. Following the current demand for user-friendly interface, semi-automated approach is aimed to be build up. Abilities to prepare advanced TEM lamellae in various geometries without rotary nanomanipulator and using various end-point detection signals are perceived as biggest advantages of this design.

scholarly journals SPICA: stereographic projection for interactive crystallographic analysis

2016 ◽  
Vol 49 (5) ◽  
pp. 1818-1826 ◽  
Author(s):  
X.-Z. Li
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Stereographic Projection ◽  
Crystallographic Analysis ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
X Ray ◽  
Research Fields ◽  
Transmission Electron

In numerous research fields, especially the applications of electron and X-ray diffraction, stereographic projection represents a powerful tool for researchers. SPICA is a new computer program for stereographic projection in interactive crystallographic analysis, which inherits features from the previous JECP/SP and includes more functions for extensive crystallographic analysis. SPICA provides fully interactive options for users to plot stereograms of crystal directions and crystal planes, traces, and Kikuchi maps for an arbitrary crystal structure; it can be used to explore the orientation relationships between two crystalline phases with a composite stereogram; it is also used to predict the tilt angles of transmission electron microscopy double-tilt and rotation holders in electron diffraction experiments. In addition, various modules are provided for essential crystallographic calculations.

New developments of computer-aided crystallographic analysis in transmission electron microscopy

2000 ◽  
Vol 33 (1) ◽  
pp. 10-25 ◽  
Author(s):  
Stefan Zaefferer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Crystallographic Analysis ◽  
Foil Thickness ◽  
Orientation Measurement ◽  
Transmission Electron ◽  
Line Measurement ◽  
On Line ◽  
Diffraction Patterns

A new computer program for on-line crystallographic analysis in transmission electron microscopy (TEM) is presented. The program is based on the fast on-line determination of single-crystal orientations from Kikuchi and spot patterns. Spot patterns, which are particularly useful in the case of highly deformed metals, are analyzed by a new digital image processing procedure. This procedure improves the precision and ease of the orientation measurement. The program permits the on-line measurement of glide systems characterized by the Burgers vector and the crystallographic line direction of dislocations and their glide planes. The determination of twin systems, based on the misorientation calculation for any crystal structure, is included as well. The possibility of determining the foil thickness permits the complete crystallographic characterization of interfaces. Finally, the program facilitates the discrimination of phases and includes the fit of the lattice parametersa,bandcfrom diffraction patterns. The new procedures are described in detail. Application examples are given for all functions.

Preparation of Zirconium Alloys for Ion Bombardment and Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 88-89
Author(s):  
E. F. Koch ◽  
D. Lee
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Acetic Acid ◽  
Ethylene Glycol ◽  
Glacial Acetic Acid ◽  
Elevated Temperatures ◽  
Zirconium Alloys ◽  
Ion Bombardment ◽  
Sample Holder ◽  
Transmission Electron

A procedure has been developed to reveal ion induced damage in Zircaloy by transmission electron microscopy. The technique consists of using a modified twin-jet electropolishing method to prepare samples for Ni ion bombardment at elevated temperatures followed by further polishing to provide foils suitable for transmission electron microscopy. The electrolyte used to polish Zircaloy-2 consisted of 50 ml perchloric acid (70%), 175 ml glacial acetic acid, and 100 ml ethylene glycol,. A 0.005” thick and 1/8” diameter sample was first polished from one side only, using a E.A. Fischione twin jet electropolisher equipped with a sample holder designed by W.G. Johnston and J.H.Rosolowski, (Fig.1).

PM-23Development of a 2000 K Class High Temperature Sample Holder for Transmission Electron Microscopy

Microscopy ◽  
2017 ◽  
Vol 66 (suppl_1) ◽  
pp. i29-i29
Author(s):  
Shogo Kikuchi ◽  
Manabu Tezura ◽  
Tomo-o Terasawa ◽  
Tokushi Kizuka
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Sample Holder ◽  
Transmission Electron ◽  
Temperature Sample

scholarly journals Diffraction Features from (101¯4) Calcite Twins Mimicking Crystallographic Ordering

Minerals ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 720
Author(s):  
Péter Németh
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transitions ◽  
Crystallographic Analysis ◽  
Twin Interface ◽  
Orientation Change ◽  
Transmission Electron ◽  
Crystallographic Symmetry ◽  
High Resolution Tem ◽  
Diffraction Patterns

During phase transitions the ordering of cations and/or anions along specific crystallographic directions can take place. As a result, extra reflections may occur in diffraction patterns, which can indicate cell doubling and the reduction of the crystallographic symmetry. However, similar features may also arise from twinning. Here the nanostructures of a glendonite, a calcite (CaCO3) pseudomorph after ikaite (CaCO3·6H2O), from Victoria Cave (Russia) were studied using transmission electron microscopy (TEM). This paper demonstrates the occurrence of extra reflections at positions halfway between the Bragg reflections of calcite in 0kl electron diffraction patterns and the doubling of d104 spacings (corresponding to 2∙3.03 Å) in high-resolution TEM images. Interestingly, these diffraction features match with the so-called carbonate c-type reflections, which are associated with Mg and Ca ordering, a phenomenon that cannot occur in pure calcite. TEM and crystallographic analysis suggests that, in fact, (101¯4) calcite twins and the orientation change of CO3 groups across the twin interface are responsible for the extra reflections.

A method to identify dislocations in a known crystal structure by transmission electron microscopy

2011 ◽  
Vol 44 (6) ◽  
pp. 1164-1168 ◽  
Author(s):  
Yudong Zhang ◽  
Shiying Wang ◽  
Claude Esling ◽  
Jean-Sébastien Lecomte ◽  
Christophe Schuman ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dislocation Line ◽  
Dislocation Slip ◽  
Slip Systems ◽  
Sample Holder ◽  
Coordinate Transformations ◽  
Burgers Vector ◽  
Transmission Electron

This paper proposes a method to identify the type and the Burgers vector of dislocations visualizedviatransmission electron microscopy (TEM). The first step is to determine experimentally the orientation, with respect to the sample holder, of a grain of known crystal structure whose dislocation slip systems have been previously reported. With this determined orientation of the grain, the method calculates the orientation of the projections of the possible dislocation line vectors in the transmission electron microscope screen coordinate system and then compares them with the observed dislocations to identify their type and the Burgers vector. The coordinate transformations underlying the method are outlined, and its validity is demonstrated using TEM measurements on a titanium sample. The method is expected to simplify the related TEM determination work.

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