X-ray Laue diffraction by sectioned multilayers. I. Pendellösung effect and rocking curves

Using the Takagi–Taupin equations, X-ray Laue dynamical diffraction in flat and wedge multilayers is theoretically considered. Recurrence relations are obtained that describe Laue diffraction in structures that are inhomogeneous in depth. The influence of sectioned depth, imperfections and non-uniform distribution of the multilayer period on the Pendellösung effect and rocking curves is studied. Numerical simulation of Laue diffraction in multilayer structures W/Si and Mo/Si is carried out. It is shown that the determination of sectioned depths based on the period of the interference fringes of the experimental rocking curves of synchrotron radiation is not always correct.

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X‐ray determination of the Debye temperature at high pressure using high‐energy synchrotron radiation

Journal of Applied Physics ◽

10.1063/1.346446 ◽

1990 ◽

Vol 68 (6) ◽

pp. 2719-2722 ◽

Cited By ~ 2

Author(s):

A. Matsumuro ◽

M. Kobayashi ◽

T. Kikegawa ◽

M. Senoo

Keyword(s):

High Pressure ◽

Synchrotron Radiation ◽

Debye Temperature ◽

High Energy ◽

X Ray

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Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

Journal of Applied Crystallography ◽

10.1107/s0021889810052015 ◽

2011 ◽

Vol 44 (1) ◽

pp. 177-183 ◽

Cited By ~ 7

Author(s):

Catherine Dejoie ◽

Martin Kunz ◽

Nobumichi Tamura ◽

Colin Bousige ◽

Kai Chen ◽

...

Keyword(s):

Incident Energy ◽

Flux Variation ◽

Laue Diffraction ◽

X Ray ◽

Measured Flux ◽

Highly Sensitive ◽

Diffraction Patterns ◽

Energy Dependent ◽

Flux Curve

Although the spectrum originating from a superconducting bending magnet is quasi-continuous, it shows important intensity variations through its spectral range. A method to determine the incident energy-dependent flux variation based on the comparison between observed intensities and the calculated intensities of a well known structure (calcite) is presented here. It is found that the measured flux is highly sensitive to the use of correct Debye–Waller factors for the atoms of the standard crystal. By using the measured flux curve, it was possible to unambiguously index the Laue diffraction pattern of a trigonal crystal structure in its hexagonal setting. This is a crucial but difficult first step for the determination of strain and stress in materials with this symmetry, such as quartz, Mg, Ti, Znetc.

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Determination of the alloying content in the matrix of Zr alloys using synchrotron radiation microprobe X-ray fluorescence

Journal of Nuclear Materials ◽

10.1016/s0022-3115(03)00267-8 ◽

2003 ◽

Vol 321 (2-3) ◽

pp. 221-232 ◽

Cited By ~ 22

Author(s):

A Yilmazbayhan ◽

O Delaire ◽

A.T Motta ◽

R.C Birtcher ◽

J.M Maser ◽

...

Keyword(s):

Synchrotron Radiation ◽

X Ray ◽

The Matrix ◽

Zr Alloys

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Protein–ligand complex structure from serial femtosecond crystallography using soaked thermolysin microcrystals and comparison with structures from synchrotron radiation

Acta Crystallographica Section D Structural Biology ◽

10.1107/s2059798317008919 ◽

2017 ◽

Vol 73 (8) ◽

pp. 702-709 ◽

Cited By ~ 5

Author(s):

Hisashi Naitow ◽

Yoshinori Matsuura ◽

Kensuke Tono ◽

Yasumasa Joti ◽

Takashi Kameshima ◽

...

Keyword(s):

Synchrotron Radiation ◽

Room Temperature ◽

Complex Structure ◽

Binding Mode ◽

Ligand Complex ◽

X Ray ◽

Cell Parameters ◽

Serial Femtosecond Crystallography ◽

Small Molecule Ligand

Serial femtosecond crystallography (SFX) with an X-ray free-electron laser is used for the structural determination of proteins from a large number of microcrystals at room temperature. To examine the feasibility of pharmaceutical applications of SFX, a ligand-soaking experiment using thermolysin microcrystals has been performed using SFX. The results were compared with those from a conventional experiment with synchrotron radiation (SR) at 100 K. A protein–ligand complex structure was successfully obtained from an SFX experiment using microcrystals soaked with a small-molecule ligand; both oil-based and water-based crystal carriers gave essentially the same results. In a comparison of the SFX and SR structures, clear differences were observed in the unit-cell parameters, in the alternate conformation of side chains, in the degree of water coordination and in the ligand-binding mode.

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Diffuse x-ray scattering from InGaAs/GaAs quantum dots

MRS Proceedings ◽

10.1557/proc-799-z6.6/n8.6/t6.6 ◽

2003 ◽

Vol 799 ◽

Author(s):

Rolf Köhler ◽

Daniil Grigoriev ◽

Michael Hanke ◽

Martin Schmidbauer ◽

Peter Schäfer ◽

...

Keyword(s):

Quantum Dots ◽

Synchrotron Radiation ◽

Diffuse Scattering ◽

Data Evaluation ◽

X Ray ◽

X Ray Scattering ◽

Gaas Matrix ◽

Wetting Layers ◽

Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

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