Improvements in high power LDMOS amplifier efficiency realized through the application of mixed-signal active loadpull

Author(s):  
Travis A. Barbieri ◽  
Basim Noori
Keyword(s):  
2008 ◽  
Vol 1079 ◽  
Author(s):  
William Murphy ◽  
Tom C Lee ◽  
Jonathan Chapple-Sokol ◽  
Daniel A Delibac ◽  
Z. X. He ◽  
...  

ABSTRACTIn this paper, we report a novel method to improve aluminum interconnect electromigration performance, reduce metal line sheet resistance (Rs) and reduce via contact resistance (Rc) in a minimum pitch design. We report the effects of bottom redundancy layers on electrical line and via resistance and upstream electromigration performance. We studied 4 metallization stacks: (I) Ti/TiN/AlCu/Ti/TiN, (II) Ti/TiN/Ti/AlCu/Ti/TiN (annealed at 400°C for 20 minutes), (III) a flash process/stack I, (IV) stack III with aluminum deposition temperature of 250°C. Aluminum deposition temperature in stacks I, II, and III are 200°C. Bottom Ti/TiN, AlCu, and Top Ti/TiN layers have the same thickness for all these stacks. Metal line Rs and via contact resistances (Rc) of stack IV are 5% and 10% lower, respectively, than stack I. Stack II metal line sheet resistance is 15% higher than stack I, which is attributed to Al consumption in the TiAl3 formation during 400°C/20minutes annealing. Electromigration performance is best with stack IV followed by III, II, then I.


Author(s):  
T. Kolasa ◽  
J. C. De La Torre ◽  
L. Bertram

Abstract In this paper, we will present our solution to the problem of test based fault localization in the failure analysis laboratory environment. The test system described herein is currently used for a number of high power mixed signal application specific integrated circuits (ASICs) that incorporate functions including switching power supplies, charge pumps, high current drivers, precision references, ADCs/DACs, comparator circuits, and digital cores. The solution addresses the shortcomings of alternative options through modular construction, compact size, and use of a commercially available graphical software compiler to create the control code and graphical user interface (GUI).


Author(s):  
Tuan Anh Vu ◽  
Tuan Dinh Pham ◽  
Duong Gia Bach

This paper presents high-efficiency high-gain 2.4 GHz power amplifiers (PAs) for wireless communications. Two class-B PAs are designed and verified in 0.13 µm CMOS mixed-signal/RF process provided by TSMC. The PAs employs cascode topologies with wideband multi-stage matchings. The single-stage cascode PA is designed for a high power added efficiency (PAE) of 35.4% while the gain is 20.4 dB over the -3 dB bandwidth between 2.4 GHz and 2.48 GHz. The two-stage cascode PA is targeted for a high gain of 37.7 dB while it exhibits a peak PAE of 24.1%. Supplied by 1.2 V supply voltages, the PAs consume DC powers of 4.5 mW and 9 mW, respectively.


2003 ◽  
Vol 83 (16) ◽  
pp. 3308-3310 ◽  
Author(s):  
Niu Jin ◽  
Sung-Yong Chung ◽  
Anthony T. Rice ◽  
Paul R. Berger ◽  
Ronghua Yu ◽  
...  

2005 ◽  
Vol 48 (2) ◽  
pp. 208-217 ◽  
Author(s):  
Matthew Watson ◽  
Carl Byington ◽  
Douglas Edwards ◽  
Sanket Amin

2018 ◽  
Vol 49 (1) ◽  
pp. 47-62 ◽  
Author(s):  
Petra C. Schmid

Abstract. Power facilitates goal pursuit, but how does power affect the way people respond to conflict between their multiple goals? Our results showed that higher trait power was associated with reduced experience of conflict in scenarios describing multiple goals (Study 1) and between personal goals (Study 2). Moreover, manipulated low power increased individuals’ experience of goal conflict relative to high power and a control condition (Studies 3 and 4), with the consequence that they planned to invest less into the pursuit of their goals in the future. With its focus on multiple goals and individuals’ experiences during goal pursuit rather than objective performance, the present research uses new angles to examine power effects on goal pursuit.


2016 ◽  
Vol 101 (5) ◽  
pp. 721-730 ◽  
Author(s):  
Shirli Kopelman ◽  
Ashley E. Hardin ◽  
Christopher G. Myers ◽  
Leigh Plunkett Tost
Keyword(s):  

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