Vertically-Stacked Silicon Nanosheet Field Effect Transistors at 3nm Technology Nodes

2019 ◽  
Author(s):  
T.P. Dash ◽  
S. Dey ◽  
E. Mohapatra ◽  
S. Das ◽  
J. Jena ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Technology Nodes

Multi-Gate Fin Field-Effect Transistors Junctions Optimization by Conventional Ion Implantation for (Sub-)22 nm Technology Nodes Circuit Applications

2011 ◽  
Vol 50 (4) ◽  
pp. 04DC16 ◽  
Author(s):  
Anabela Veloso ◽  
An De Keersgieter ◽  
Stephan Brus ◽  
Naoto Horiguchi ◽  
Philippe P. Absil ◽  
...  
Keyword(s):  
Ion Implantation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Technology Nodes

Vertically-stacked silicon nanosheet field effect transistors at 3 nm technology nodes - simulation at nanoscale

2020 ◽  
Vol 12 (3) ◽  
pp. 224
Author(s):  
E. Mohapatra ◽  
T.P. Dash ◽  
S. Dey ◽  
J. Jena ◽  
S. Das ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Technology Nodes

Vertically-stacked silicon nanosheet field effect transistors at 3 nm technology nodes - simulation at nanoscale

2020 ◽  
Vol 12 (3) ◽  
pp. 224
Author(s):  
C.K. Maiti ◽  
J. Jena ◽  
S. Das ◽  
E. Mohapatra ◽  
S. Dey ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Technology Nodes

Multi-Gate Fin Field-Effect Transistors Junctions Optimization by Conventional Ion Implantation for (Sub-)22 nm Technology Nodes Circuit Applications

2011 ◽  
Vol 50 (4S) ◽  
pp. 04DC16 ◽  
Author(s):  
Anabela Veloso ◽  
An De Keersgieter ◽  
Stephan Brus ◽  
Naoto Horiguchi ◽  
Philippe P. Absil ◽  
...  
Keyword(s):  
Ion Implantation ◽  
Field Effect ◽  
Field Effect Transistors ◽  
Technology Nodes

Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes

2021 ◽  
Vol 42 (10) ◽  
pp. 1420-1423
Author(s):  
Fong-Min Ciou ◽  
Jia-Hong Lin ◽  
Po-Hsun Chen ◽  
Ting-Chang Chang ◽  
Kai-Chun Chang ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Hot Carrier ◽  
P Type ◽  
Technology Nodes ◽  
Hot Carrier Degradation
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