Virtual System for Sheet Resistance Measurement of Inkjet Printed Conductive Layers

Author(s):  
Georgi Todorov Nikolov ◽  
Elitsa Emilova Gieva ◽  
Boyanka Marinova Nikolova ◽  
Ivelina Nikolaeva Ruskova
2006 ◽  
Vol 19 (1) ◽  
pp. 2-9 ◽  
Author(s):  
S. Enderling ◽  
C.L.S. Smith ◽  
M.H. Dicks ◽  
J.T.M. Stevenson ◽  
M. Mitkova ◽  
...  

2006 ◽  
Vol 912 ◽  
Author(s):  
Trudo H. Clarysse ◽  
Alain Moussa ◽  
Frederik Leys ◽  
Roger Loo ◽  
Wilfried Vandervorst ◽  
...  

AbstractComparison of state-of-the-art zero-penetration sheet resistance tools on ultra-shallow Boron CVD layers on top of a medium doped As layer.


1985 ◽  
Vol 63 (6) ◽  
pp. 890-893 ◽  
Author(s):  
M. Simard-Normandin ◽  
C. Slaby

Low-energy boron implants in silicon are analyzed using secondary-ion mass spectroscopy and standard junction and sheet-resistance measurement techniques. Implantation of 11B+ is compared with that of [Formula: see text]. The concentration profiles are compared with Linhard–Scharf–Schiott theory and improved range parameters are obtained.


2013 ◽  
Vol 109 ◽  
pp. 334-337 ◽  
Author(s):  
J. Lehmann ◽  
C. Leroux ◽  
M. Charles ◽  
A. Torres ◽  
E. Morvan ◽  
...  

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