High temperature performance study of gold wire bonding on a palladium bonding pad

Author(s):  
Wardhana Sasangka ◽  
A. Tan
2012 ◽  
Vol 2012 (CICMT) ◽  
pp. 000334-000338
Author(s):  
Jens Müller ◽  
Thomas Mache ◽  
Torsten Thelemann

Electroless plating on silver is a low cost alternative to printing of mixed metals or pure gold paste systems on LTCC. It overcomes the necessity to have material transitions from inner to outer layers or from conductor lines to wire bonding- or solder-pads. Since no commercial process and material set for silver thick film conductors has been available on the market a proprietary Ni/Pd/Au coating technology was developed for the use on silver inks for LTCC and Al2O3-ceramic as a base for both soldering and wire bonding. The work included the screening of different chemicals as well as several silver paste systems from two commercial vendors. Conductor adhesion, plating layer thicknesses, plating accuracy, (lead free) solderability and gold wire-bondability were assessed to optimize the process. Layers of about 5 microns Ni, (0.1 to 0.3) microns Pd and (0.05 to 0.15) microns Au were electrolessly deposited. The developed Ni-Pd-Au finish is an economical alternative with only about a quarter of the cost compared to the conventional use of silver, silver / palladium and gold compounds for ceramic substrates. This technology allows coating of the structures down to a fine pad size of 200×200 microns and a minimum line width of 100 microns, without reducing the adhesion mechanism between thick-film metallization and ceramic substrate. By covering of pure conductors with high temperature glass or dielectrics, further material saving is possible. Besides, the process offers also very good coating of structures in cavities.


Author(s):  
Pradeep Lall ◽  
Shantanu Deshpande ◽  
Luu Nguyen

Gold wire bonding has been widely used as first-level interconnect in semiconductor packaging. The increase in the gold price has motivated the industry search for alternative to the gold wire used in wire bonding and the transition to copper wire bonding technology. Potential advantages of transition to Cu-Al wire bond system includes low cost of copper wire, lower thermal resistivity, lower electrical resistivity, higher deformation strength, damage during ultrasonic squeeze, and stability compared to gold wire. However, the transition to the copper wire brings along some trade-offs including poor corrosion resistance, narrow process window, higher hardness, and potential for cratering. Formation of excessive Cu-Al intermetallics may increase electrical resistance and reduce the mechanical bonding strength. Current state-of-art for studying the Cu-Al system focuses on accumulation of statistically significant number of failures under accelerated testing. In this paper, a new approach has been developed to identify the occurrence of impending apparently-random defect fall-outs and pre-mature failures observed in the Cu-Al wirebond system. The use of intermetallic thickness, composition and corrosion as a leading indicator of failure for assessment of remaining useful life for Cu-al wirebond interconnects has been studied under exposure to high temperature and temperature-humidity. Damage in wire bonds has been studied using x-ray Micro-CT. Microstructure evolution was studied under isothermal aging conditions of 150°C, 175°C, and 200°C till failure. Activation energy was calculated using growth rate of intermetallic at different temperatures. Effect of temperature and humidity on Cu-Al wirebond system was studied using Parr Bomb technique at different elevated temperature and humidity conditions (110°C/ 100%RH, 120°C/ 100%RH, 130°C/ 100%RH) and failure mechanism was developed. The present methodology uses evolution of the IMC thickness, composition in conjunction with the Levenberg-Marquardt algorithm to identify accrued damage in wire bond subjected to thermal aging. The proposed method can be used for quick assessment of Cu-Al parts to ensure manufactured part consistency through sampling.


2016 ◽  
Vol 857 ◽  
pp. 31-35
Author(s):  
Wan Yusmawati Wan Yusoff ◽  
Azman Jalar ◽  
Norinsan Kamil Othman ◽  
Irman Abdul Rahman

The effect of high temperature storage of gold ball bonds towards micromechanical properties has been investigated. Gold wire from thermosonic wire bonding exposed to high temperature storage at 150 °C for 10, 100 and 1000 hours. The nanoindentation test was used in order to evaluate the high temperature storage effect on wire bonding in more details and localized. Prior to nanoindentation test, the specimens were cross-sectioned diagonally. The constant load nanoindentation was performed at the center of gold ball bond to investigate the hardness and reduced modulus. The load-depth curve of nanoindentation for the high temperature storage gold wire has apparent the discontinuity during loading compared to as-received gold wire. The hardness value increased after subjected to high temperature storage. However, the hardness decreased when the storage period is extended. The decreasing in the hardness value may due to the grain size of Au metal which recrystallized after subjected to high temperature storage. The results obtained from nanoindentation is important in assessing the high temperature storage of wire bonding.


Author(s):  
S. A. Kudtarkar ◽  
R. Murcko ◽  
K. Srihari ◽  
S. Saiyed

Wire bonding is widely used as one of the main interconnect alternatives. This technique applies significant mechanical stresses on the bond pads along with heat and ultrasonic energy to form a bond. An interconnection of copper plus low k material has been a focus of the semiconductor industry with the goal of reducing interconnection delays. The material is below the wire bond pads and complicates the mechanical stability of the device during wire bonding. The low k materials that are suggested are very sensitive to these mechanical stresses. This generates a significant reliability concern for the underlying metal structures. In addition, the integrity of the bond formed may be negatively impacted from a reliability perspective because of the softer material properties of the dielectric. This research explores the ball bond integrity for die with SiO2 and low k dielectric underlying material respectively, using 0.8 mil thick (20 microns) gold wire. Accelerated tests, such as high temperature storage at 150°C and 175°C, were conducted to assess the reliability of these bonds. The results of this investigation reveal that the ball bond’s strength degrades after high temperature tests due to the occurrence of Kirkendall voids between the gold wire and the aluminum bond pad. The degradation recorded was more severe for regular die than its low k counterpart.


2018 ◽  
Vol 2018 (1) ◽  
pp. 000760-000766
Author(s):  
Zhenzhen Shen ◽  
Aleksey Reiderman

Abstract The implementation of microelectronics, also known as multi-chip modules (MCM), is extensive in automotive, downhole and aerospace applications. MCMs have already demonstrated high-temperature performance, step improvement in reliability, and the potential to reduce product cost through miniaturization and integration of more functions. However, there are barriers preventing wider adoption of MCM technology in downhole applications. High non-recurring expenditures (NRE) charges increase development costs. Long substrate lead times prolong the time to market. Lengthy design iterations make it difficult to apply lean startup methodology to accelerate innovation. The main factor that leads to high NRE and long lead times is the complexity of substrate manufacturing processes. Together with assembly, MCM manufacturing comprises at least 11 steps, 6 different materials, 10 or more different machines, and requires a minimum of 6 supporting employees. A new concept proposes a simplified process to reduce labor and expenses. With best implementation, this process would require only a single machine capable of cycling through 3-step process of dispensing, placement and cure. Despite the dramatically simplified process, the constructional complexity of circuits can still be very high, such as a 3D multilayer MCM. In this paper, this concept was evaluated, micro-dispensing equipment was used to create basic circuitry blocks. Different materials to create conductive traces, isolation layers and wire bond replacement were evaluated. High-temperature aging tests were conducted to monitor the electrical and mechanical performance under thermal stress. The feasibility of dispensing fine features using dispensing and jetting methods are presented in the study. Conductors are a critical part in microelectronic assemblies because they create interconnects and thermal dissipation paths for microelectronics. Three different conductor materials were tested for their dispensability, resistance, continuity at temperature, and coefficients of thermal expansion (CTE) compatibility with different materials under thermal cycling. For dielectric materials, the requirements were to create various assembly constructs. The characterization included dispensability, electrical insulation, breakdown voltage, high-temperature performance, and the effects of CTE. Different approaches with different materials were tested for feasibility for wire bonding replacement. The application needs fine feature size with medium resistance lines. Consequently, the criteria for the material selection are fine particle size and medium sheet resistance. For high-power devices where heavy-gauge wires were used, jet dispensing is applicable. For other application with regular wire diameters, direct write is used. The over-all tests demonstrated the feasibility of using dispensed materials to replace wire bonds, which brings better reliability for shock and vibration, as compared to traditional wire bonds. The reliability of this approach requires a set of optimally matched conductive and dielectric materials. Three conductive materials (A, B and C) and three dielectric materials (D, E and F) were evaluated in this study. Tested conductive epoxy A can be used for attachment of SMT components with non-tin terminals, short traces, and wire bonding replacement for 25-μm wires, but it is not ideal for fine lines(<65um). Tested conductive epoxy B can be used for fine traces (58μm), and wire bonding replacement for 25-μm wires. The resistance of that material is not ideal. Nano-silver paste can be used for long traces, heavy-gauge wire bonding replacement, pads/polygons, the sheet resistance is equivalent to 0.5Oz Cu. For dielectrics, epoxy C can be used for crossovers, dielectric layers, and components staking. Epoxy D can be used for die edge insulation, but it is not ideal. Epoxy E can be used for crossovers and components staking. Epoxy F can be used for encapsulation and components staking. The wire bonding replacement concept structure is established with the dielectric forming the insulation around die edge, then the conductive wires dispensed on top of it. Feasibility was confirmed, a proof-of-concept was built, and some level of thermal stress was tested on the samples. Particle size and viscosity are critical to achieve fine features for micro-dispensing conductors and dielectrics. Periodic evaluations must be conducted to follow up on industry's progress with materials.


2017 ◽  
Vol 2017 ◽  
pp. 1-10 ◽  
Author(s):  
Yongchun Cheng ◽  
Chunfeng Zhu ◽  
Guojin Tan ◽  
Zehua Lv ◽  
Jinsheng Yang ◽  
...  

In order to improve the performance of asphalt mastic, some researchers have added diatomite or basalt fiber as a modifier to the asphalt mastic, and the results show that some properties of the asphalt mastic were improved. For the simultaneous addition of diatomite and basalt fiber, two kinds of modifier, compound modified asphalt mastic had not been reported; in this paper, thirteen groups of diatomite and basalt fiber (DBFCMAM) compound modified asphalt mastic with different content were prepared to study the performance. Softening point, cone penetration, viscosity, and DSR tests were conducted, for the high temperature performance evaluation of DBFCMAM, whereas force ductility and BBR tests were used in the low temperature performance study of the DBFCMAM. The results demonstrated that the high temperature performance of DBFCMAM was increased; moreover, the low temperature performance of DBFCMAM improved by diatomite and basalt fiber according to the results of the force ductility test; however, the conclusion of the BBR test data was inconsistent with the force ductility test. In summary, the high temperature and low temperature properties of DBFCMAM had been improved.


Alloy Digest ◽  
1996 ◽  
Vol 45 (1) ◽  

Abstract Allegheny Ludlum AL276 is widely used in the most severe environments found in chemical plants and in power plant desulfurization systems. The high molybdenum level with tungsten gives excellent pitting and crevice corrosion resistance. This datasheet provides information on composition, physical properties, hardness, elasticity, and tensile properties. It also includes information on low and high temperature performance, and corrosion resistance as well as forming, heat treating, joining, and surface treatment. Filing Code: Ni-497. Producer or source: Allegheny Ludlum Corporation.


Alloy Digest ◽  
1995 ◽  
Vol 44 (3) ◽  

Abstract NICROFER 5520 Co is a nickel-chromium-cobalt-molybdenum alloy with excellent strength and creep properties up to high temperatures. Due to its balanced chemical composition the alloy shows outstanding resistance to high temperature corrosion in the form of oxidation and carburization. This datasheet provides information on composition, physical properties, elasticity, and tensile properties. It also includes information on high temperature performance as well as forming, heat treating, machining, and joining. Filing Code: Ni-480. Producer or source: VDM Technologies Corporation.


Sign in / Sign up

Export Citation Format

Share Document