Atomic-scale modeling of source-to-drain tunneling in ultimate Schottky barrier double-gate MOSFETs
2004 ◽
Vol 48
(4)
◽
pp. 567-574
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Keyword(s):
Keyword(s):
2011 ◽
Vol 384
(1-2)
◽
pp. 176-183
◽
2002 ◽
Vol 49
(11)
◽
pp. 1897-1902
◽
2019 ◽
Vol 73
(12)
◽
pp. 972-982
◽
Keyword(s):
Keyword(s):