Thermal noise analysis of SGMOSFET for different substrate and gate oxides
2016 ◽
Vol 44
(12)
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pp. 2101-2113
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2014 ◽
Vol 24
(01)
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pp. 1550010
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2015 ◽
Vol 645-646
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pp. 624-629
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2011 ◽
Vol 58-60
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pp. 2074-2078
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1995 ◽
Vol 117
(4)
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pp. 405-410
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1978 ◽
Vol AES-14
(4)
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pp. 698-698
1999 ◽
Vol 9
(2)
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pp. 4095-4098
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