Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology
2016 ◽
Vol 65
(4)
◽
pp. 1055-1067
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2018 ◽
Vol 65
(1)
◽
pp. 426-431
◽
2008 ◽
Vol 48
(7)
◽
pp. 995-999
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