Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

Author(s):  
Chang-Tzu Wang ◽  
Ming-Dou Ker ◽  
Tien-Hao Tang ◽  
Kuan-Cheng Su
2017 ◽  
Vol 14 (10) ◽  
pp. 20170315-20170315
Author(s):  
Fan Yang ◽  
Yongan Zheng ◽  
Chunguang Wang ◽  
Ling Shen ◽  
Huailin Liao

2016 ◽  
Vol 65 (4) ◽  
pp. 1055-1067 ◽  
Author(s):  
Jinhui Wang ◽  
Lina Wang ◽  
Haibin Yin ◽  
Zikui Wei ◽  
Zezhong Yang ◽  
...  

2018 ◽  
Vol 65 (1) ◽  
pp. 426-431 ◽  
Author(s):  
Moon-Kyu Cho ◽  
Ickhyun Song ◽  
Spyridon Pavlidis ◽  
Zachary E. Fleetwood ◽  
Stephen P. Buchner ◽  
...  

2008 ◽  
Vol 48 (7) ◽  
pp. 995-999 ◽  
Author(s):  
Xiaoyang Du ◽  
Shurong Dong ◽  
Yan Han ◽  
Juin J. Liou ◽  
Mingxu Huo ◽  
...  

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