Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique
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2016 ◽
Vol E99.C
(10)
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pp. 1219-1225
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2016 ◽
Vol 4
(2)
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pp. 333
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2011 ◽
Vol E94-C
(6)
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pp. 1072-1075
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