Current-Voltage Characteristics of Organic Molecular Wires by Conducting Atomic Force Microscopy

2007 ◽  
Author(s):  
N.J. Lee ◽  
S.B. Kim ◽  
S.H. Koo ◽  
Y.J. Choi ◽  
J.W. Kim ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Wires ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics

Atomic Force Microscopy of the Local Electrical Properties of Bilayer Polyaniline-Polystyrene/P(VDF-TrFE) Composite

2021 ◽  
Vol 899 ◽  
pp. 506-511
Author(s):  
Artem V. Budaev ◽  
Ivanna N. Melnikovich ◽  
Vasily E. Melnichenko ◽  
Nikita A. Emelianov
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Properties ◽  
Polymer Nanocomposite ◽  
Charge Carriers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Piezoelectric Force Microscopy ◽  
Microscopy Techniques

Atomic force microscopy techniques (conductive-AFM, I-V spectroscopy and PFM) were used for characterisation of the local electrical properties of bilayer polyaniline-polystyrene/P(VDF-TrFE) polymer nanocomposite. Observed hysteresis of current-voltage characteristics confirms its memristive properties. It was caused by the influence of the ferroelectric polarization of P(VDF-TrFE) layer, the domain structure of which was visualised by piezoelectric force microscopy on the transport of charge carriers at the interface.

scholarly journals Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy

2020 ◽  
pp. 94-98
Author(s):  
N. A. Davletkildeev ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Oxidative Polymerization ◽  
Pyrolytic Graphite ◽  
Thin Layers ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics

Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm

Current-voltage Characteristics of Single CdSe Colloidal Nanodots Measured by Conductive-tip Atomic Force Microscopy

2002 ◽  
Vol 737 ◽  
Author(s):  
Ichiro Tanaka ◽  
Eri Kawasaki ◽  
O. Ohtsuki ◽  
K. Uno ◽  
M. Hara ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Sample Surface ◽  
Self Assembled Monolayer ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Being Moved

ABSTRACTWe have investigated current-voltage characteristics of individual CdSe colloidal nanodots by conductive-tip atomic force microscopy (AFM). The colloidal nanodots were spun-coat and scattered on a self-assembled monolayer of thiophene molecules formed on Au (111) surfaces for single dot measurements. A thin SiO2 layer was deposited on the sample surface in order to prevent the dots being moved by the tip during measurement. We imaged the topography of isolated single dots by AFM operated in contact mode, and measured current-voltage characteristics with the conductive tip positioned on single dots; large conductivity changes which suggest resonant tunneling through a quantized energy level in the dot was observed even at room temperature.

scholarly journals The effect of hydrogen etching on 6H-SiC studied by temperature-dependent current-voltage and atomic force microscopy

2004 ◽  
Vol 85 (9) ◽  
pp. 1547-1549 ◽  
Author(s):  
S. Doğan ◽  
D. Johnstone ◽  
F. Yun ◽  
S. Sabuktagin ◽  
J. Leach ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Hydrogen Etching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage
Sign in / Sign up

Export Citation Format

Share Document