Comparison of the kt 2 Extraction Methods of Piezoelectric Films in Film/Substrate Structure and Self-Standing Film Structure

2021 ◽  
Author(s):  
Yuki Shimizu ◽  
Keita Kondo ◽  
Takahiko Yanagitani
Keyword(s):  
Extraction Methods ◽  
Film Structure ◽  
Substrate Structure ◽  
Piezoelectric Films ◽  
Film Substrate

scholarly journals Brewster angles for a dissipative film structure

2020 ◽  
Vol 63 (6) ◽  
pp. 672-679
Author(s):  
A. B. Sotsky ◽  
S. S. Miheev ◽  
M. M. Nazarov
Keyword(s):  
Aqueous Solution ◽  
Analytical Solution ◽  
Dissipative Structure ◽  
Protein Concentration ◽  
Film Structure ◽  
Thz Spectroscopy ◽  
Reflection Coefficients ◽  
Measurement Sensitivity ◽  
Film Substrate ◽  
Absorbing Substrate

The conditions of converting the reflection coefficients of plane TM or TE for a film-substrate dissipative structure are determined. As a result, the possibilities to maximize the measurement sensitivity by the THz spectroscopy method of the protein concentration in an aqueous solution are established, and the analytical solution to the inverse optical problem of determining the complex permittivity and thickness of a weakly absorbing film located on a weakly absorbing substrate is obtained.

Study of Laser-Driven Shock Wave Propagation in Film-Substrate Structure Material

2016 ◽  
Vol 43 (5) ◽  
pp. 0503003
Author(s):  
叶云霞 Ye Yunxia ◽  
赵抒怡 Zhao Shuyi ◽  
左慧 Zuo Hui
Keyword(s):  
Shock Wave ◽  
Wave Propagation ◽  
Shock Wave Propagation ◽  
Substrate Structure ◽  
Film Substrate

Buckling behavior of metal film/substrate structure under pure bending

2008 ◽  
Vol 92 (13) ◽  
pp. 131902 ◽  
Author(s):  
Ying Li ◽  
Xi-Shu Wang ◽  
Xiang-Kang Meng
Keyword(s):  
Metal Film ◽  
Pure Bending ◽  
Substrate Structure ◽  
Buckling Behavior ◽  
Film Substrate

Substrate Latent Heat Effects in The Calculations for Pulsed Laser Irradiated Thin Films

1983 ◽  
Vol 13 ◽  
Author(s):  
J.J. Cao ◽  
K. Rose ◽  
O. Aina ◽  
W. Katz ◽  
J. Norton
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Pulsed Laser ◽  
Phase Changes ◽  
Morphological Observation ◽  
Substrate Structure ◽  
Heat Effects ◽  
Film Substrate ◽  
Scanning Electron ◽  
Pulsed Laser Irradiation

ABSTRACTWe present a numerical model for the calculation of the temperature rise caused by pulsed laser irradiation of a thin film/substrate structure. This model includes phase changes in both the thin film and the substrate. The inclusion of phase changes results in more complex thermal behavior and significantly affects melt durations. This model was applied to the AuGe/GaAs system. Morphological observation using the scanning electron microscope and SIMS profiles provides experimental verification for the numerical calculations.

Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact

2004 ◽  
Vol 43 (3) ◽  
pp. 1205-1206 ◽  
Author(s):  
Takaaki Hibi ◽  
Takaharu Nagatomi ◽  
Yoshizo Takai ◽  
Ken-ichi Obori ◽  
Syogo Awata ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Electron Impact ◽  
Monte Carlo Study ◽  
X Ray ◽  
Substrate Structure ◽  
Film Substrate

Analyses of Interfacial Thermal Stresses for DLC/WC-Co

2011 ◽  
Vol 189-193 ◽  
pp. 3870-3873
Author(s):  
Jun Zhang ◽  
Yang Li ◽  
Xin Li Wei
Keyword(s):  
Thermal Stresses ◽  
Fem Simulation ◽  
Thermal Expansion Mismatch ◽  
Airy Functions ◽  
Cobalt Alloy ◽  
Interface Damage ◽  
Substrate Structure ◽  
Stress Strain Relation ◽  
Calculation Results ◽  
Film Substrate

Thermal expansion mismatch is the most important which leads to the film/substrate interface damage and destruction. In this paper, the interface stresses analyses was conducted using Airy functions for the diamond-like carbon (DLC) film/ tungsten cobalt alloy(WC-Co) substrate structure; according to stress-strain relation, obtain the interface stress expression by substituting into the boundary conditions for giving parameter. The calculation results were analyzed and compared with the FEM simulation.

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