scholarly journals Impact of Self-Heating Effect on Transistor Characterization and Reliability Issues in Sub-10 nm Technology Nodes

2019 ◽  
Vol 7 ◽  
pp. 829-836 ◽  
Author(s):  
Yi Zhao ◽  
Yiming Qu
2010 ◽  
Vol 107 (6) ◽  
pp. 063107
Author(s):  
D. W. Xu ◽  
C. Z. Tong ◽  
S. F. Yoon ◽  
L. J. Zhao ◽  
Y. Ding ◽  
...  

Silicon ◽  
2019 ◽  
Vol 12 (4) ◽  
pp. 975-986 ◽  
Author(s):  
Behrooz Abdi Tahne ◽  
Ali Naderi ◽  
Fatemeh Heirani
Keyword(s):  

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