Impact of Self-Heating Effect on Transistor Characterization and Reliability Issues in Sub-10 nm Technology Nodes
2019 ◽
Vol 7
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pp. 829-836
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2017 ◽
Vol 64
(2)
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pp. 646-648
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2020 ◽
Vol 1699
◽
pp. 012006
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Keyword(s):
Keyword(s):
2019 ◽
Vol 7
◽
pp. 1264-1269
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