Dual Gate Charge Trap Flash Memory for Highly Reliable Triple Level Cell using Capacitive Coupling Effects

2016 ◽  
pp. 1-1 ◽  
Author(s):  
Min-Ju Ahn ◽  
Won-Ju Cho
2013 ◽  
Vol 34 (6) ◽  
pp. 756-758 ◽  
Author(s):  
Ki-Hyun Jang ◽  
Hyun-June Jang ◽  
Jin-Kwon Park ◽  
Won-Ju Cho

Author(s):  
Ting Cheng ◽  
Jianquan Jia ◽  
Lei Jin ◽  
Xinlei Jia ◽  
Shiyu Xia ◽  
...  

2019 ◽  
Vol 66 (1) ◽  
pp. 378-382 ◽  
Author(s):  
Jungmin Moon ◽  
Tae Yoon Lee ◽  
Hyun Jun Ahn ◽  
Tae In Lee ◽  
Wan Sik Hwang ◽  
...  

2020 ◽  
Vol 126 (3) ◽  
Author(s):  
Ravi Ranjan ◽  
Nitesh Kashyap ◽  
Ashish Raman

Author(s):  
Shantanu Rajwade ◽  
Hitesh Arora ◽  
Jonathan Shaw ◽  
Ulrich Wiesner ◽  
Edwin C. Kan
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