Dual Gate Charge Trap Flash Memory for Highly Reliable Triple Level Cell using Capacitive Coupling Effects
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2013 ◽
Vol 34
(6)
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pp. 756-758
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2019 ◽
Vol 66
(1)
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pp. 378-382
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2013 ◽
Vol 60
(10)
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pp. 3256-3264
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2015 ◽
Vol 16
(4)
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pp. 187-189
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