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Fluorine Effects Originating From the CVD-W Process on Charge-Trap Flash Memory Cells
IEEE Transactions on Electron Devices
◽
10.1109/ted.2018.2873693
◽
2019
◽
Vol 66
(1)
◽
pp. 378-382
◽
Cited By ~ 6
Author(s):
Jungmin Moon
◽
Tae Yoon Lee
◽
Hyun Jun Ahn
◽
Tae In Lee
◽
Wan Sik Hwang
◽
...
Keyword(s):
Flash Memory
◽
Memory Cells
◽
Charge Trap
Download Full-text
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References
Analysis of AC- gm dispersions due to traps in nitride charge trap layer and generated interface traps in 3-D NAND flash memory cells
2016 IEEE Silicon Nanoelectronics Workshop (SNW)
◽
10.1109/snw.2016.7577994
◽
2016
◽
Author(s):
Ho-Jung Kang
◽
Min-Kyu Jeong
◽
Nagyong Choi
◽
Byung-Gook Park
◽
Jong-Ho Lee
Keyword(s):
Flash Memory
◽
Interface Traps
◽
Memory Cells
◽
Nand Flash
◽
Nand Flash Memory
◽
Charge Trap
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Investigation of trap profile in nitride charge trap layer in 3-D NAND flash memory cells
2017 China Semiconductor Technology International Conference (CSTIC)
◽
10.1109/cstic.2017.7919730
◽
2017
◽
Author(s):
Jong-Ho Lee
◽
Ho-Jung Kang
Keyword(s):
Flash Memory
◽
Memory Cells
◽
Nand Flash
◽
Nand Flash Memory
◽
Charge Trap
Download Full-text
Enhanced memory performance by tailoring the microstructural evolution of (ZrO2)0.6(SiO2)0.4 charge trapping layer in the nanocrystallites-based charge trap flash memory cells
Applied Physics A
◽
10.1007/s00339-012-6877-7
◽
2012
◽
Vol 108
(1)
◽
pp. 217-222
◽
Cited By ~ 13
Author(s):
Zhenjie Tang
◽
Xinhua Zhu
◽
Hanni Xu
◽
Yidong Xia
◽
Jiang Yin
◽
...
Keyword(s):
Microstructural Evolution
◽
Flash Memory
◽
Memory Performance
◽
Charge Trapping
◽
Memory Cells
◽
Charge Trap
Download Full-text
Effects of Gate/Blocking Oxide Energy Barrier on Memory Characteristics in Charge Trap Flash Memory Cells
Nanoscience and Nanotechnology Letters
◽
10.1166/nnl.2015.2002
◽
2015
◽
Vol 7
(7)
◽
pp. 594-598
Author(s):
Dong Hua Li
◽
Wandong Kim
◽
Won Bo Shim
◽
Se Hwan Park
◽
Yoon Kim
◽
...
Keyword(s):
Flash Memory
◽
Energy Barrier
◽
Memory Cells
◽
Charge Trap
◽
Memory Characteristics
Download Full-text
Impact of the interfaces in the charge trap layer on the storage characteristics of ZrO2/Al2O3 nanolaminate-based charge trap flash memory cells
Materials Letters
◽
10.1016/j.matlet.2012.10.024
◽
2013
◽
Vol 92
◽
pp. 21-24
◽
Cited By ~ 31
Author(s):
Zhenjie Tang
◽
Xinhua Zhu
◽
Hanni Xu
◽
Yidong Xia
◽
Jiang Yin
◽
...
Keyword(s):
Flash Memory
◽
Memory Cells
◽
Charge Trap
◽
Storage Characteristics
Download Full-text
Improvement of Characteristics with a Sub-5 nm Ge-Doped Silicon Nitride Layer in Charge Trap Flash Memory Cells
Nanoscience and Nanotechnology Letters
◽
10.1166/nnl.2016.2036
◽
2016
◽
Vol 8
(7)
◽
pp. 577-580
Author(s):
Dong Hua Li
◽
Wandong Kim
◽
Won Bo Shim
◽
Se Hwan Park
◽
Yoon Kim
◽
...
Keyword(s):
Silicon Nitride
◽
Flash Memory
◽
Nitride Layer
◽
Memory Cells
◽
Charge Trap
◽
Silicon Nitride Layer
◽
Doped Silicon
Download Full-text
Investigation of Re-program Scheme in Charge Trap Based 3D NAND Flash Memory
IEEE Journal of the Electron Devices Society
◽
10.1109/jeds.2021.3081635
◽
2021
◽
pp. 1-1
Author(s):
Ting Cheng
◽
Jianquan Jia
◽
Lei Jin
◽
Xinlei Jia
◽
Shiyu Xia
◽
...
Keyword(s):
Flash Memory
◽
Program Scheme
◽
Nand Flash
◽
Nand Flash Memory
◽
Charge Trap
Download Full-text
The dominant mechanisms of hot-hole injection induced SILC and their correlation with disturbs in N-flash memory cells
1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)
◽
10.1109/vtsa.1999.786049
◽
2003
◽
Cited By ~ 1
Author(s):
S.S. Chung
◽
C.M. Yih
◽
Z.H. Ho
◽
C.J. Lin
◽
D.S. Kuo
◽
...
Keyword(s):
Flash Memory
◽
Hole Injection
◽
Memory Cells
Download Full-text
Field-induced generation of electron traps in the tunnel oxide of flash memory cells
2015 IEEE International Integrated Reliability Workshop (IIRW)
◽
10.1109/iirw.2015.7437077
◽
2015
◽
Cited By ~ 1
Author(s):
Yuri Tkachev
Keyword(s):
Flash Memory
◽
Memory Cells
◽
Electron Traps
Download Full-text
TCAD Simulation of Data Retention Characteristics of Charge Trap Device for 3-D NAND Flash Memory
2015 IEEE International Memory Workshop (IMW)
◽
10.1109/imw.2015.7150306
◽
2015
◽
Cited By ~ 6
Author(s):
Dongyean Oh
◽
Bonghoon Lee
◽
Eunmee Kwon
◽
Sangyong Kim
◽
Gyuseog Cho
◽
...
Keyword(s):
Flash Memory
◽
Nand Flash
◽
Nand Flash Memory
◽
Data Retention
◽
Charge Trap
◽
Retention Characteristics
◽
Tcad Simulation
Download Full-text
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