Temperature monitoring with a fully integrable on chip interferometric silicon micro-sensor based on the thermo-optic effect

2002 ◽  
Author(s):  
G. Cocorullo ◽  
F.G. Della Corte ◽  
M. Iodice ◽  
I. Rendina ◽  
P.M. Sarro
Keyword(s):  
Temperature Monitoring ◽  
Micro Sensor ◽  
On Chip

scholarly journals Design of a Real-Time Breakdown Voltage and On-Chip Temperature Monitoring System for Single Photon Avalanche Diodes

Electronics ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 25
Author(s):  
Shijie Deng ◽  
Alan P. Morrison ◽  
Yong Guo ◽  
Chuanxin Teng ◽  
Ming Chen ◽  
...  
Keyword(s):  
Real Time ◽  
Breakdown Voltage ◽  
Count Rate ◽  
Single Photon ◽  
Photon Counting ◽  
Temperature Monitoring ◽  
Dark Count ◽  
Chip Temperature ◽  
Avalanche Diodes ◽  
On Chip

The design and implementation of a real-time breakdown voltage and on-chip temperature monitoring system for single photon avalanche diodes (SPADs) is described in this work. In the system, an on-chip shaded (active area of the detector covered by a metal layer) SPAD is used to provide a dark count rate for the breakdown voltage and temperature calculation. A bias circuit was designed to provide a bias voltage scanning for the shaded SPAD. A microcontroller records the pulses from the anode of the shaded SPAD and calculates its real-time dark count rate. An algorithm was developed for the microcontroller to calculate the SPAD’s breakdown voltage and the on-chip temperature in real time. Experimental results show that the system is capable of measuring the SPAD’s breakdown voltage with a mismatch of less than 1.2%. Results also show that the system can provide real-time on-chip temperature monitoring for the range of −10 to 50 °C with errors of less than 1.7 °C. The system proposed can be used for the real-time SPAD’s breakdown voltage and temperature estimation for dual-SPADs or SPAD arrays chip where identical detectors are fabricated on the same chip and one or more dummy SPADs are shaded. With the breakdown voltage and the on-chip temperature monitoring, intelligent control logic can be developed to optimize the performance of the SPAD-based photon counting system by adjusting the parameters such as excess bias voltage and dead-time. This is particularly useful for SPAD photon counting systems used in complex working environments such as the applications in 3D LIDAR imaging for geodesy, geology, geomorphology, forestry, atmospheric physics and autonomous vehicles.

scholarly journals On-Chip Temperature Monitoring of a SiC Current Limiter

2004 ◽  
Vol 457-460 ◽  
pp. 1021-1024 ◽  
Author(s):  
Dominique Tournier ◽  
Phillippe Godignon ◽  
José Millan ◽  
Dominique Planson ◽  
Jean-Pierre Chante ◽  
...  
Keyword(s):  
Temperature Monitoring ◽  
Chip Temperature ◽  
Current Limiter ◽  
On Chip

scholarly journals Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring

2015 ◽  
Vol 50 (11) ◽  
pp. 2475-2490 ◽  
Author(s):  
A. K. M. Mahfuzul Islam ◽  
Jun Shiomi ◽  
Tohru Ishihara ◽  
Hidetoshi Onodera
Keyword(s):  
Temperature Monitoring ◽  
On Chip
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