SEU and MBU Angular Dependence of Samsung and Micron 8-Gbit SLC NAND-Flash Memories under Heavy-Ion Irradiation

2011 ◽  
Author(s):  
Kai Grurmann ◽  
Dietmar Walter ◽  
Martin Herrmann ◽  
Fritz Gliem ◽  
Heikki Kettunen ◽  
...  
Keyword(s):  
Angular Dependence ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Heavy Ion Irradiation

scholarly journals Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

2011 ◽  
Author(s):  
Timothy R. Oldham ◽  
Melanie Berg ◽  
Mark Friendlich ◽  
Ted Wilcox ◽  
Christina Seidleck ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Heavy Ion Irradiation

Effects of Heavy-Ion Irradiation on Vertical 3-D NAND Flash Memories

2018 ◽  
Vol 65 (1) ◽  
pp. 318-325 ◽  
Author(s):  
M. Bagatin ◽  
S. Gerardin ◽  
A. Paccagnella ◽  
S. Beltrami ◽  
E. Camerlenghi ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Heavy Ion Irradiation

Angular Dependence of SOI Transistor Response to Heavy Ion Irradiation

2010 ◽  
Author(s):  
Mélanie Raine ◽  
Marc Gaillardin ◽  
Philippe Paillet ◽  
Jean-Etienne Sauvestre ◽  
Olivier Duhamel ◽  
...  
Keyword(s):  
Angular Dependence ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Angular dependence of multiple-bit upset response in static random access memories under heavy ion irradiation

2013 ◽  
Vol 22 (8) ◽  
pp. 086102 ◽  
Author(s):  
Zhan-Gang Zhang ◽  
Jie Liu ◽  
Ming-Dong Hou ◽  
You-Mei Sun ◽  
Hong Su ◽  
...  
Keyword(s):  
Angular Dependence ◽  
Ion Irradiation ◽  
Random Access ◽  
Heavy Ion ◽  
Heavy Ion Irradiation ◽  
Static Random Access Memories

scholarly journals Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

2017 ◽  
Vol 64 (1) ◽  
pp. 332-337 ◽  
Author(s):  
Dakai Chen ◽  
Edward Wilcox ◽  
Raymond L. Ladbury ◽  
Hak Kim ◽  
Anthony Phan ◽  
...  
Keyword(s):  
Flash Memory ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Nand Flash ◽  
Single Event ◽  
Nand Flash Memory ◽  
Single Event Upsets ◽  
Heavy Ion Irradiation ◽  
Fluence Dependence

Sound velocity of glassy Pd 80 Si 20 after heavy-ion irradiation at low temperatures

2002 ◽  
Vol 82 (11) ◽  
pp. 2333-2339
Author(s):  
G. Schumacher ◽  
R. C. Birtcher ◽  
D. P. Renusch ◽  
M. Grimsditch ◽  
L. E. Rehn
Keyword(s):  
Sound Velocity ◽  
Low Temperatures ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
Heavy Ion Irradiation

Exploration of heavy ion irradiation effects on gate oxide reliability in power MOSFETs

1995 ◽  
Vol 35 (3) ◽  
pp. 603-608 ◽  
Author(s):  
S.R. Anderson ◽  
R.D. Schrimpf ◽  
K.F. Galloway ◽  
J.L. Titus
Keyword(s):  
Ion Irradiation ◽  
Gate Oxide ◽  
Heavy Ion ◽  
Irradiation Effects ◽  
Power Mosfets ◽  
Heavy Ion Irradiation ◽  
Oxide Reliability

A Heavy-ion Beam Monitor Based on 3D NAND Flash Memories

2021 ◽  
pp. 1-1
Author(s):  
S. Gerardin ◽  
M. Bagatin ◽  
A. Paccagnella ◽  
S. Beltrami ◽  
A. Costantino ◽  
...  
Keyword(s):  
Ion Beam ◽  
Heavy Ion ◽  
Nand Flash ◽  
Flash Memories ◽  
Beam Monitor ◽  
Heavy Ion Beam
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