The Effect of Surface Morphology of Substrates Upon Electrical Stability of Nichrome Thin Film Resistors

1961 ◽  
Vol 8 (4) ◽  
pp. 160-162 ◽  
Author(s):  
W. Lasko ◽  
H. Roth
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
Electrical Stability ◽  
Thin Film Resistors ◽  
Effect Of Surface

Effect of Surface Ambient on Manganese Diffusion in Gallium Arsenide

1991 ◽  
Vol 240 ◽  
Author(s):  
C. H. Wu ◽  
K. C. Hsieh
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
Gaas Substrate ◽  
Smooth Surface ◽  
High Surface ◽  
Source Data ◽  
Mn Diffusion ◽  
Diffusion Source ◽  
Mn Concentration ◽  
Effect Of Surface

ABSTRACTData are presented showing the effects of diffusion sources, surface encapsulation, and As overpressure on Mn diffusion in GaAs. Four different Mn-containing sources are used, including Mn, Mn,MN3As, and MnAs granules as well as Mn thin film deposited directly onto GaAs substrate. Smooth surface morphology with high surface Mn concentration can be obtained using MnAs (and in certain conditions, Mn3As) as diffusion source; different degrees of surface degradation are observed if otherwise sources are used as diffusion source. Data also show surface encapsulation and As overpressure have significant effects on the reaction between the source and GaAs and the Mn diffusion in GaAs.

scholarly journals Effect of Surface Morphology in ZnO:Al/Ag Back Reflectors for Flexible Silicon Thin Film Solar Cells on Light Scattering Properties

2010 ◽  
Vol 20 (10) ◽  
pp. 501-507 ◽  
Author(s):  
Sang-Hun Beak ◽  
Jeong-Chul Lee ◽  
Sang-Hyun Park ◽  
Jin-Soo Song ◽  
Kyung-Hoon Yoon ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Light Scattering ◽  
Surface Morphology ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
Back Reflectors ◽  
Effect Of Surface

Effect of Surface Morphology on the Optical Properties in Metal−Dielectric−Metal Thin Film Systems

2011 ◽  
Vol 3 (4) ◽  
pp. 1148-1153 ◽  
Author(s):  
Eunice S. P. Leong ◽  
Yan Jun Liu ◽  
Bing Wang ◽  
Jinghua Teng
Keyword(s):  
Thin Film ◽  
Optical Properties ◽  
Surface Morphology ◽  
Metal Thin Film ◽  
Effect Of Surface

Study on Low TCR TaN Thin Film Resistors by D.C. Magnetron Sputtering

2014 ◽  
Vol 1082 ◽  
pp. 34-37 ◽  
Author(s):  
Bin Wang ◽  
Zhen Guo Song ◽  
Qian Tao Cao
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
Magnetron Sputtering ◽  
Anodic Oxidation ◽  
Oxidation Process ◽  
Ceramic Substrates ◽  
Film Resistor ◽  
Thin Film Resistor ◽  
Thin Film Resistors ◽  
Anodic Oxidation Process

In this paper, TaN thin film were deposited on ceramic substrates by D.C. magnetron sputtering. The surface morphology of two types of TaN thin film resistors were investigated by SEM. The characteristics of the TaN thin film resistor was also studied. The key point was put on the TCR of the TaN thin film resistors. The resistors were trimmed by the autoxidation process and the anodic oxidation process, and the TCR values of about +21ppm/°C and-137.3ppm/°C in average have been achieved respectively.

Ultra fine MnO2 nanowire based high performance thin film rechargeable electrodes: Effect of surface morphology, electrolytes and concentrations

2012 ◽  
Vol 22 (38) ◽  
pp. 20465 ◽  
Author(s):  
Ranjusha R. ◽  
A. Sreekumaran Nair ◽  
Seeram Ramakrishna ◽  
Anjali P. ◽  
Sujith K. ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
High Performance ◽  
Effect Of Surface

scholarly journals Current Noise in Thick and Thin Film Resistors

1983 ◽  
Vol 10 (2-3) ◽  
pp. 81-85 ◽  
Author(s):  
S. Demolder ◽  
A. Van Calster ◽  
M. Vandendriessche
Keyword(s):  
Thin Film ◽  
Thick Film ◽  
Measured Data ◽  
Measuring Circuit ◽  
Current Noise ◽  
High Quality ◽  
Thin Film Resistors

In this paper a sensitive measuring circuit is described for the measurement of current noise on high quality thin and thick film resistors. Measured data on resistors are presented and analysed.

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