A Die Attach Design for Thermoelectric Generator Packages for Automotive Applications

Author(s):  
Shams Arifeen ◽  
Victor Wolemiwa ◽  
Dominic Nwoke ◽  
Gabriel P. Potirniche ◽  
Aicha Elshabini ◽  
...  
2011 ◽  
Vol 40 (5) ◽  
pp. 1136-1143 ◽  
Author(s):  
Molan Li ◽  
Shaohui Xu ◽  
Qiang Chen ◽  
Li-Rong Zheng

Author(s):  
Victor Adrian Chiriac ◽  
Tien-Yu Tom Lee

An extensive 3-D conjugate numerical study is conducted to assess the thermal performance of the novel 54 lead SOIC (with inverted exposed Cu pad) packages for automotive applications. The thermal performance of the modified designs with exposed pad are investigated, ranging from smaller die/flag size to larger ones, with single or multiple heat sources operating under various powering conditions. The thermal performance is compared to other existing packages with typical application to the automotive industry. The impact of the lead frame geometrical structure and die attach material on the overall thermal behavior is evaluated. Under one steady state (4W) operating scenario, the package reaches a peak temperature of 117.1°C, corresponding to a junction-to-heatsink thermal resistance Rjhs of 4.27°C/W. For the design with a slightly smaller Cu alloy exposed pad (Cu Alloy), the peak temperature reached by the FETs is 117.8°C, slightly higher than for the design with the intermediate size flag. In this case, the junction-to-heatsink thermal resistance Rj-hs is 4.45°C/W. The worst case powering scenario is identified, with 1.312W/FET and total power of 10.5W, barely satisfying the overall thermal budget. The variation of the peak (junction) temperature is also evaluated for several powering scenarios. Finally, a comparison with a different exposed pad package is made. The impact of the higher thermal conductivity (solder) die attach is evaluated and compared to the epoxy die attach in the 54 lead SOIC package. Several cases are evaluated in the paper, with an emphasis on the superior thermal performance of new packages for automotive applications.


Author(s):  
Victor Chiriac ◽  
Tien-Yu Tom Lee

An extensive 3-D conjugate numerical study is conducted to assess the thermal performance of the novel Power Quad Flat No Lead (PQFN) packages for automotive applications. Several PQFN packages are investigated, ranging from smaller die/flag size to larger ones, single or multiple heat sources, operating under various powering and boundary conditions. The steady state and transient thermal performance are compared to those of the classical packages, and the impact of the thicker lead frame and die attach material on the overall thermal behavior is also evaluated. Under one steady state (1W) operating scenario, the PQFN package reaches a peak temperature of ~106.3°C, while under 37W@40ms of transient powering, the peak temperature reached by the corner FET is ~260.8°C. With an isothermal boundary (85°C) attached to the board backside, the junction temperature does not change, as the PCB has no significant thermal impact. However, when the isothermal boundary is attached to package bottom, it leads to a drop in by almost 20% after 40 ms. Additional transient cases are evaluated, with an emphasis on the superior thermal performance of this new class of power packages for automotive applications.


2019 ◽  
Vol 68 (6) ◽  
pp. 5366-5378 ◽  
Author(s):  
Romina Rodriguez ◽  
Matthias Preindl ◽  
James S. Cotton ◽  
Ali Emadi

2019 ◽  
Vol 50 (5) ◽  
pp. 451-462
Author(s):  
Abhishek Khanchi ◽  
Mani Kanwar Singh ◽  
Harkirat Sandhu ◽  
Satbir Sehgal

Author(s):  
Yuanyuan Wang ◽  
Mengjun Zhang ◽  
Yuanyuan Tian ◽  
Zihua Wu ◽  
Jiaojiao Xing ◽  
...  

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