Physical and Electrical Characterization of Metal–Insulator–Metal Capacitors With $\hbox{Sm}_{2}\hbox{O}_{3}$ and $\hbox{Sm}_{2}\hbox{O}_{3}/\hbox{SiO}_{2}$ Laminated Dielectrics for Analog Circuit Applications

2009 ◽  
Vol 56 (11) ◽  
pp. 2683-2691 ◽  
Author(s):  
Jing-De Chen ◽  
Jian-Jun Yang ◽  
Rick Wise ◽  
Philipp Steinmann ◽  
Ming-Bin Yu ◽  
...  
Keyword(s):  
Analog Circuit ◽  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Insulator Metal

Physical and electrical characterization of HfO2 metal–insulator–metal capacitors for Si analog circuit applications

2003 ◽  
Vol 94 (1) ◽  
pp. 551-557 ◽  
Author(s):  
Hang Hu ◽  
Chunxiang Zhu ◽  
Y. F. Lu ◽  
Y. H. Wu ◽  
T. Liew ◽  
...  
Keyword(s):  
Analog Circuit ◽  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Insulator Metal

Electrical characterization of a-C:H as a dielectric material in metal/insulator/metal structures

2010 ◽  
pp. NA-NA
Author(s):  
C. Zúñiga-I. ◽  
A. Kosarev ◽  
A. Torres-J. ◽  
P. Rosales-Q. ◽  
W. Calleja-A. ◽  
...  
Keyword(s):  
Dielectric Material ◽  
Electrical Characterization ◽  
Metal Insulator ◽  
Metal Structures ◽  
Metal Insulator Metal

Physical and electrical characterization of high-k ZrO2 metal–insulator–metal capacitor

2008 ◽  
Vol 516 (23) ◽  
pp. 8333-8336 ◽  
Author(s):  
Joo-Hyung Kim ◽  
Velislava Ignatova ◽  
Peter Kücher ◽  
Johannes Heitmann ◽  
Lars Oberbeck ◽  
...  
Keyword(s):  
Electrical Characterization ◽  
Metal Insulator ◽  
High K ◽  
Metal Insulator Metal
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