High Threshold Voltage Uniformity and Low Hysteresis Recessed-Gate Al2O3/AlN/GaN MISFET by Selective Area Growth
2017 ◽
Vol 64
(4)
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pp. 1554-1560
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2006 ◽
Vol 203
(7)
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pp. 1872-1875
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2016 ◽
Vol 37
(9)
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pp. 1193-1196
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2021 ◽
Vol 1851
(1)
◽
pp. 012006
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