scholarly journals Scattering Parameters Characterization of Periodically Nonuniform Transmission Lines With a Perturbative Technique

2020 ◽  
Vol 62 (6) ◽  
pp. 2595-2603 ◽  
Author(s):  
Xiaokang Liu ◽  
Xinglong Wu ◽  
Flavia Grassi ◽  
Giordano Spadacini ◽  
Dries Vande Ginste ◽  
...  
Keyword(s):  
Transmission Lines ◽  
Scattering Parameters ◽  
Nonuniform Transmission Lines

Mixed-Port Hybrid Parameters for High-Speed Differential Lines

2018 ◽  
Vol 2018 (1) ◽  
pp. 000380-000383
Author(s):  
A. Ege Engin ◽  
Ivan Ndip ◽  
Klaus-Dieter Lang ◽  
Jerry Aguirre
Keyword(s):  
Transmission Lines ◽  
Mixed Mode ◽  
High Speed ◽  
Mode Conversion ◽  
Network Analyzer ◽  
Scattering Parameters ◽  
Coupled Lines ◽  
Tightly Coupled ◽  
Insight Into

Abstract High-speed transmission lines are commonly routed as differential lines to control sensitivity to noise on the reference planes at higher speeds. The preferred method of characterization of differential lines is in terms of mixed-mode scattering parameters, as they provide insight into the behavior of differential and common signals, as well as the mode conversion among them. These mixed-mode scattering parameters can be mathematically obtained from single-ended parameters, which can for example be measured with a 4-port vector network analyzer. There has been recent concerns about the so-obtained mixed-mode scattering parameters, especially for tightly-coupled lines, resulting in extended or modified definitions of mixed-mode scattering parameters. This can be a point of confusion in interpreting the behavior of differential lines. In this paper we introduce the mixed-port hybrid parameters, which do not suffer from any such ambiguous definitions, as they are based on intuitive differential and common-port excitations of the network. As such, mixed-port hybrid parameters can be used to analyze the mixed-mode performance of any arbitrary 4-port network, certainly including coupled or asymmetrical lines, without any ambiguity.

scholarly journals Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

Electronics ◽  
2021 ◽  
Vol 10 (11) ◽  
pp. 1275
Author(s):  
Simone Scafati ◽  
Enza Pellegrino ◽  
Francesco de Paulis ◽  
Carlo Olivieri ◽  
James Drewniak ◽  
...  
Keyword(s):  
Standard Technique ◽  
Single Step ◽  
Scattering Parameters ◽  
Linear Set ◽  
S Parameter ◽  
Parameter Conversion ◽  
Before And After ◽  
One Step ◽  
Typical Measurement

The de-embedding of measurement fixtures is relevant for an accurate experimental characterization of radio frequency and digital electronic devices. The standard technique consists in removing the effects of the measurement fixtures by the calculation of the transfer scattering parameters (T-parameters) from the available measured (or simulated) global scattering parameters (S-parameters). The standard de-embedding is achieved by a multiple steps process, involving the S-to-T and subsequent T-to-S parameter conversion. In a typical measurement setup, two fixtures are usually placed before and after the device under test (DUT) allowing the connection of the device to the calibrated vector network analyzer coaxial ports. An alternative method is proposed in this paper: it is based on the newly developed multi-network cascading algorithm. The matrices involved in the fixture-DUT-fixture cascading gives rise to a non-linear set of equations that is in one step analytically solved in closed form, obtaining a unique solution. The method is shown to be effective and at least as accurate as the standard multi-step de-embedding one.

Characterization of arcs in ICRF transmission lines

2009 ◽  
Vol 84 (2-6) ◽  
pp. 685-688 ◽  
Author(s):  
R. D’Inca ◽  
A. Onyshchenko ◽  
F. Braun ◽  
G. Siegl ◽  
V. Bobkov ◽  
...  
Keyword(s):  
Transmission Lines

High-power InAlAs/InGaAs Schottky barrier photodiodes for analog microwave signal transmission

2022 ◽  
Vol 43 (1) ◽  
pp. 012302
Author(s):  
K. S. Zhuravlev ◽  
A. L. Chizh ◽  
K. B. Mikitchuk ◽  
A. M. Gilinsky ◽  
I. B. Chistokhin ◽  
...  
Keyword(s):  
Schottky Barrier ◽  
Transmission Lines ◽  
High Power ◽  
High Speed ◽  
Signal Transmission ◽  
Mesa Structure ◽  
Microwave Characterization ◽  
Absorbing Layer ◽  
Analog Transmission

Abstract The design, manufacturing and DC and microwave characterization of high-power Schottky barrier InAlAs/InGaAs back-illuminated mesa structure photodiodes are presented. The photodiodes with 10 and 15 μm mesa diameters operate at ≥40 and 28 GHz, respectively, have the output RF power as high as 58 mW at a frequency of 20 GHz, the DC responsivity of up to 1.08 A/W depending on the absorbing layer thickness, and a photodiode dark current as low as 0.04 nA. We show that these photodiodes provide an advantage in the amplitude-to-phase conversion factor which makes them suitable for use in high-speed analog transmission lines with stringent requirements for phase noise.

Analysis of Characteristic of Microstrip Signal Loss in Course of Signal Transmission

2011 ◽  
Vol 194-196 ◽  
pp. 2229-2232
Author(s):  
Qing Song Xiong ◽  
Zhao Hua Wu ◽  
Pin Chen ◽  
Sheng Zhang
Keyword(s):  
Line Width ◽  
Transmission Lines ◽  
Coupling Effect ◽  
Signal Transmission ◽  
Characteristic Impedance ◽  
Signal Loss ◽  
Scattering Parameters ◽  
Scattering Parameter ◽  
Conductor Loss ◽  
Strip Lines

The effect of loss of transmission line on the transmission signal can’t be ignored in microwave circuits. Based on the theory of loss and microwave network principle, the effect of the width, parallel length and space of transmission lines on the scattering parameters’ insertion loss is analyzed in perspective of scattering parameters of the odd mode and even mode. The simulation results show that: when the other parameters are fixed, both the characteristic impedance and the conductor loss decrease non-linearly with the line width broadening; due to the coupling effect between micro-strip lines, the first trough frequency of the scattering parameter S21 curved line, that is the point the signal energy attenuate most seriously, decreases linearly with line width broadening and increases non- linearly with line spaces broadening.

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