Total Ionizing Dose and Single Event Effects Hardness Assurance Qualification Issues for Microelectronics

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2001268 ◽

2008 ◽

Vol 55 (4) ◽

pp. 1926-1946 ◽

Author(s):

Marty R. Shaneyfelt ◽

James R. Schwank ◽

Paul E. Dodd ◽

James A. Felix

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects

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Total ionizing dose and single event effects of 1 Mb HfO2-based resistive-random-access memory

Microelectronics Reliability ◽

10.1016/j.microrel.2018.07.017 ◽

2018 ◽

Vol 88-90 ◽

pp. 891-897 ◽

Author(s):

Jinshun Bi ◽

Yuan Duan ◽

Kai Xi ◽

Bo Li

Keyword(s):

Random Access ◽

Random Access Memory ◽

Resistive Random Access Memory ◽

Single Event ◽

Total Ionizing Dose ◽

Access Memory ◽

Single Event Effects

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906647 ◽

2019 ◽

Author(s):

Alvson D. Topper ◽

Edward J. Wyrwas ◽

Kaitlyn Ryder ◽

Kenneth A. LaBel ◽

Jonathan A. Pellish ◽

...

Keyword(s):

Space Flight ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects ◽

Damage Dose ◽

Nasa Goddard Space ◽

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JICG CMOS transistors for reduction of total ionizing dose and single event effects in a 130 nm bulk SiGe BiCMOS technology

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2020.164832 ◽

2021 ◽

Vol 987 ◽

pp. 164832

Author(s):

R. Sorge ◽

J. Schmidt ◽

Ch. Wipf ◽

F. Reimer ◽

F. Teply ◽

...

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects ◽

Cmos Transistors ◽

Bicmos Technology ◽

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Single event effects and total ionizing dose results of a low voltage EEPROM

2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) ◽

10.1109/redw.2000.896271 ◽

2002 ◽

Author(s):

D. Krawzsenek ◽

P. Hsu ◽

H. Anthony ◽

C. Land

Keyword(s):

Low Voltage ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects

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Megarad total ionizing dose and single event effects test results of a radhard-by-design 0.25 micron ASIC [space applications]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352914 ◽

2005 ◽

Author(s):

M. Hartwell ◽

C. Hafer ◽

P. Milliken ◽

T. Farris

Keyword(s):

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Space Applications ◽

Single Event Effects

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

2014 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2014.7004560 ◽

2014 ◽

Author(s):

Kenneth A. LaBel ◽

Martha V. O'Bryan ◽

Dakai Chen ◽

Michael J. Campola ◽

Megan C. Casey ◽

...

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects

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Radiation effects in advanced SOI devices: New insights into Total Ionizing Dose and Single-Event Effects

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ◽

10.1109/s3s.2013.6716530 ◽

2013 ◽

Author(s):

M. Gaillardin ◽

M. Raine ◽

P. Paillet ◽

M. Martinez ◽

C. Marcandella ◽

...

Keyword(s):

Radiation Effects ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Effects ◽

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Total Ionizing dose and single event effects test results of a Radiation Hardness-by-Design Library for 0.15μm fully depleted SOI-AISC

2009 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2009.5994729 ◽

2009 ◽

Author(s):

A. Makihara ◽

T. Ebihara ◽

T. Yokose ◽

Y. Tsuchiya ◽

Y. Miyazaki ◽

...

Keyword(s):

Radiation Hardness ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Fully Depleted ◽

Single Event Effects

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Single Event Latch-up and Total Ionizing Dose Characterization of a Cobham Designed Smart Power Switch Controller

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325838 ◽

2020 ◽

Author(s):

Matt Von Thun ◽

Younes Lotfi ◽

Tim Meade ◽

Aaron Turnbull

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Smart Power ◽

Power Switch ◽

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The Optimal Estimation of Single Event Effects Sensitivity Parameters Using a Focused Laser Source and Heavy Ion Cyclotron on Example of a Library of Analog IP Units

2021 International Siberian Conference on Control and Communications (SIBCON) ◽

10.1109/sibcon50419.2021.9438936 ◽

2021 ◽

Author(s):

Alexey Y. Borisov ◽

Alexander A. Novikov ◽

Natalia L. Petrun ◽

Anastasia A. Nefedova ◽

George V. Chukov

Keyword(s):

Optimal Estimation ◽

Heavy Ion ◽

Laser Source ◽

Single Event ◽

Single Event Effects ◽

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