Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM
2008 ◽
Vol 55
(6)
◽
pp. 3394-3400
◽
Keyword(s):
2017 ◽
Vol 406
◽
pp. 443-448
◽
2014 ◽
Vol 57
(10)
◽
pp. 1902-1906
◽
2017 ◽
Vol 64
(1)
◽
pp. 654-664
◽
Keyword(s):
Keyword(s):
Keyword(s):