On-Line Deconvolution for the High Resolution Ultrasonic Pulse-Echo Measurement with Narrow-Band Transducer

1987 ◽  
Author(s):  
A. Yamada
Keyword(s):  
High Resolution ◽  
Narrow Band ◽  
Ultrasonic Pulse ◽  
On Line ◽  
Pulse Echo

On-line alignment and astigmatism correction using a TV and personal computer

1993 ◽  
Vol 51 ◽  
pp. 202-203
Author(s):  
F. Hosokawa ◽  
Y. Kondo ◽  
T. Honda ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
High Resolution ◽  
Personal Computer ◽  
Block Diagram ◽  
Incident Beam ◽  
Ccd Camera ◽  
Alignment Procedure ◽  
Astigmatism Correction ◽  
Transmission Electron ◽  
Alignment System ◽  
On Line

High-resolution transmission electron microscopy must attain utmost accuracy in the alignment of incident beam direction and in astigmatism correction, and that, in the shortest possible time. As a method to eliminate this troublesome work, an automatic alignment system using the Slow-Scan CCD camera has been introduced recently. In this method, diffractograms of amorphous images are calculated and analyzed to detect misalignment and astigmatism automatically. In the present study, we also examined diffractogram analysis using a personal computer and digitized TV images, and found that TV images provided enough quality for the on-line alignment procedure of high-resolution work in TEM. Fig. 1 shows a block diagram of our system. The averaged image is digitized by a TV board and is transported to a computer memory, then a diffractogram is calculated using an FFT board, and the feedback parameters which are determined by diffractogram analysis are sent to the microscope(JEM- 2010) through the RS232C interface. The on-line correction system has the following three modes.

VIS-NIR LED Illumination in Backside Circuit Edit and Optical Probing Applications

2012 ◽  
Author(s):  
Shida Tan ◽  
Richard H. Livengood ◽  
Dane Scott ◽  
Roy Hallstein ◽  
Pat Pardy ◽  
...  
Keyword(s):  
High Resolution ◽  
Image Quality ◽  
Optical Imaging ◽  
Narrow Band ◽  
Light Emitting Diode ◽  
Air Gap ◽  
Optical Image ◽  
Proof Of Concept ◽  
Light Emitting ◽  
Optical Probing

Abstract High resolution optical imaging is critical in assisting backside circuit edit (CE) and optical probing navigation. In this paper, we demonstrated improved optical image quality using VIS-NIR narrow band light emitting diode (LED) illumination in various FIB and optical probing platforms. The proof of concept was demonstrated with both common non-contact air gap lenses and solid immersion lenses (SIL).

Оценка реальной чувствительности приемочного ультразвукового контроля рельсов

2020 ◽  
pp. 17-27
Author(s):  
А.А. Шелухин
Keyword(s):  
Ultrasonic Pulse ◽  
Piezoelectric Transducers ◽  
Acoustic Path ◽  
Metallic Inclusion ◽  
Inclusion Type ◽  
The Real ◽  
Rail Head ◽  
Pulse Echo

In this article, the analysis of the acoustic path during the ultrasonic pulse echo testing of the rail head in production is carried out. The influence of the parameters of the applied piezoelectric transducers on the distribution of sensitivity for the sounding scheme used in the existing installations is estimated and the real sensitivity of detecting defects of the «non-metallic inclusion» type is estimated.

scholarly journals X-ray Diffraction Analysis and Williamson-Hall Method in USDM Model for Estimating More Accurate Values of Stress-Strain of Unit Cell and Super Cells (2 × 2 × 2) of Hydroxyapatite, Confirmed by Ultrasonic Pulse-Echo Test

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 2949
Author(s):  
Marzieh Rabiei ◽  
Arvydas Palevicius ◽  
Amir Dashti ◽  
Sohrab Nasiri ◽  
Ahmad Monshi ◽  
...  
Keyword(s):  
Young’S Modulus ◽  
Young's Modulus ◽  
Ultrasonic Pulse ◽  
High Accuracy ◽  
Unit Cell ◽  
Deformation Model ◽  
X Ray Diffraction ◽  
Uniform Deformation ◽  
X Ray ◽  
Pulse Echo

Taking into account X-ray diffraction, one of the well-known methods for calculating the stress-strain of crystals is Williamson-Hall (W–H). The W-H method has three models, namely (1) Uniform deformation model (UDM); (2) Uniform stress deformation model (USDM); and (3) Uniform deformation energy density model (UDEDM). The USDM and UDEDM models are directly related to the modulus of elasticity (E). Young’s modulus is a key parameter in engineering design and materials development. Young’s modulus is considered in USDM and UDEDM models, but in all previous studies, researchers used the average values of Young’s modulus or they calculated Young’s modulus only for a sharp peak of an XRD pattern or they extracted Young’s modulus from the literature. Therefore, these values are not representative of all peaks derived from X-ray diffraction; as a result, these values are not estimated with high accuracy. Nevertheless, in the current study, the W-H method is used considering the all diffracted planes of the unit cell and super cells (2 × 2 × 2) of Hydroxyapatite (HA), and a new method with the high accuracy of the W-H method in the USDM model is presented to calculate stress (σ) and strain (ε). The accounting for the planar density of atoms is the novelty of this work. Furthermore, the ultrasonic pulse-echo test is performed for the validation of the novelty assumptions.

scholarly journals Determination of the Elastic Tensor of a Textured Low-Carbon Steel

1993 ◽  
Vol 21 (1) ◽  
pp. 3-16 ◽  
Author(s):  
P. Spalthoff ◽  
W. Wunnike ◽  
C. Nauer-Gerhard ◽  
H. J. Bunge ◽  
E. Schneider
Keyword(s):  
Carbon Steel ◽  
Elastic Anisotropy ◽  
Low Carbon Steel ◽  
Elastic Stiffness ◽  
Ultrasonic Pulse ◽  
Grain Structure ◽  
Maximum Deviation ◽  
Low Carbon ◽  
The Hill ◽  
Pulse Echo

The components of the elastic stiffness tensor of hot rolled low-carbon steel were determined using an ultrasonic pulse-echo-method. They were also calculated on the basis of X-ray texture measurements using the Hill approximation. The maximum deviation between experimental and calculated values is 3.5%. An influence of the slightly anisotropic grain structure on the elastic anisotropy could not be seen.

Sign in / Sign up

Export Citation Format

Share Document