Side-wall damage in a transmission electron microscopy specimen of crystalline Si prepared by focused ion beam etching
1999 ◽
Vol 17
(4)
◽
pp. 1201-1204
◽
1998 ◽
Vol 16
(3)
◽
pp. 1127-1130
◽
2015 ◽
Vol 28
(5)
◽
pp. 1529-1538
◽
1993 ◽
Vol 11
(6)
◽
pp. 2016
◽
1993 ◽
Vol 11
(6)
◽
pp. 2127
◽
1992 ◽
Vol 10
(2)
◽
pp. 575
◽