Parametric analysis and comparative study of multimode waveguides on lithium niobate-on-insulator and silicon-on-insulator platforms

2019 ◽  
Vol 58 (10) ◽  
pp. 1 ◽  
Author(s):  
Archana Kaushalram ◽  
Gopalkrishna Hegde ◽  
Srinivas Talabattula
Keyword(s):  
Lithium Niobate ◽  
Comparative Study ◽  
Parametric Analysis ◽  
Silicon On Insulator ◽  
Multimode Waveguides

A comparative study on the domain switching characteristics of near stoichiometric lithium niobate and lithium tantalate single crystals

2005 ◽  
Vol 120 (1-3) ◽  
pp. 125-129 ◽  
Author(s):  
S. Ganesamoorthy ◽  
M. Nakamura ◽  
S. Takekawa ◽  
S. Kumaragurubaran ◽  
K. Terabe ◽  
...  
Keyword(s):  
Lithium Niobate ◽  
Comparative Study ◽  
Single Crystals ◽  
Domain Switching ◽  
Lithium Tantalate ◽  
Switching Characteristics

A Comparative Study for the Backside Illumination (BSI) Technology Using Bonding Wafer Cleaning Process for Advanced CMOS Image Sensor

2012 ◽  
Vol 195 ◽  
pp. 75-78
Author(s):  
Chung Kyung Jung ◽  
Sung Wook Joo ◽  
Seoung Hun Jeong ◽  
Sang Wook Ryu ◽  
Han Choon Lee ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Comparative Study ◽  
Quantum Efficiency ◽  
Wafer Bonding ◽  
Image Sensor ◽  
Silicon On Insulator ◽  
Cleaning Process ◽  
Electrochemical Systems ◽  
Wafer Cleaning ◽  
Direct Wafer Bonding

Over the last decades, the concept of backside illumination (BSI) sensors has become one of the leading solutions to optical challenges such as improved quantum efficiency (QE), and cross-talk, respectively [1-. Direct wafer bonding is a method for fabricating advanced substrates for micro-electrochemical systems (MEMS) and integrated circuits (IC). The most typical example of such an advanced substrate is the silicon-on-insulator (SOI) wafer.

Comparative study of defect structures in lithium niobate with different compositions

1992 ◽  
Vol 101 (2) ◽  
pp. 340-352 ◽  
Author(s):  
N. Iyi ◽  
K. Kitamura ◽  
F. Izumi ◽  
J.K. Yamamoto ◽  
T. Hayashi ◽  
...  
Keyword(s):  
Lithium Niobate ◽  
Comparative Study ◽  
Defect Structures

scholarly journals Comparative study of 0° X-cut and Y + 36°-cut lithium niobate high-voltage sensing

2015 ◽  
Vol 86 (8) ◽  
pp. 085001 ◽  
Author(s):  
N. Patel ◽  
D. W. Branch ◽  
E. Schamiloglu ◽  
S. Cular
Keyword(s):  
Lithium Niobate ◽  
Comparative Study ◽  
High Voltage ◽  
Voltage Sensing

Comparative study of impurities in lithium tantalite and lithium niobate

2018 ◽  
Vol 143 (3) ◽  
pp. 1918-1918
Author(s):  
Chandrima Chatterjee ◽  
Daniel Miller ◽  
Igor Ostrovskii
Keyword(s):  
Lithium Niobate ◽  
Comparative Study

Comparative Study of Traditional and Broadband Piston Mode Designs of A1-Mode Resonators on Lithium Niobate

2021 ◽  
Author(s):  
Yawei Li ◽  
Qi Liang ◽  
Yu-Po Wong ◽  
Keyuan Gong ◽  
Zhaohui Wu ◽  
...  
Keyword(s):  
Lithium Niobate ◽  
Comparative Study ◽  
Piston Mode
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