scholarly journals Digital imaging sensor identification (further study)

Author(s):  
Mo Chen ◽  
Jessica Fridrich ◽  
Miroslav Goljan
2003 ◽  
Vol 52 (5) ◽  
pp. 1566-1572
Author(s):  
G.C. Giakos ◽  
S. Chowdhury ◽  
N. Shah ◽  
S. Guntupalli ◽  
S. Vedantham ◽  
...  

Author(s):  
Yoshie Ishii ◽  
Koji Masuda ◽  
Yoshinori Hayashi ◽  
Teruaki Mitsuya ◽  
Shigeyuki Haruyama

In development of technology and product, it’s important to make decisions based on technology trend. Some previous studies obtained technology trend based on patent information. In our previous study, we tried to investigate the state of innovation and the emergence of dominant design by using patent information. We analyzed inkjet printers and NC machines with theme codes and F term codes in Japanese patent classification codes. In this study, we tried to know the change of technology of other products other than inkjet printers or NC machines by using patent information. The target product of this study is camera. Camera products changed its key technology of imaging and recording from analogue film to digital imaging sensor and semiconductor memories. We attempted to obtain this change by using patent information.


Author(s):  
W.A. Carrington ◽  
F.S. Fay ◽  
K.E. Fogarty ◽  
L. Lifshitz

Advances in digital imaging microscopy and in the synthesis of fluorescent dyes allow the determination of 3D distribution of specific proteins, ions, GNA or DNA in single living cells. Effective use of this technology requires a combination of optical and computer hardware and software for image restoration, feature extraction and computer graphics.The digital imaging microscope consists of a conventional epifluorescence microscope with computer controlled focus, excitation and emission wavelength and duration of excitation. Images are recorded with a cooled (-80°C) CCD. 3D images are obtained as a series of optical sections at .25 - .5 μm intervals.A conventional microscope has substantial blurring along its optical axis. Out of focus contributions to a single optical section cause low contrast and flare; details are poorly resolved along the optical axis. We have developed new computer algorithms for reversing these distortions. These image restoration techniques and scanning confocal microscopes yield significantly better images; the results from the two are comparable.


Author(s):  
John F. Mansfield

The current imaging trend in optical microscopy, scanning electron microscopy (SEM) or transmission electron microscopy (TEM) is to record all data digitally. Most manufacturers currently market digital acquisition systems with their microscope packages. The advantages of digital acquisition include: almost instant viewing of the data as a high-quaity positive image (a major benefit when compared to TEM images recorded onto film, where one must wait until after the microscope session to develop the images); the ability to readily quantify features in the images and measure intensities; and extremely compact storage (removable 5.25” storage devices which now can hold up to several gigabytes of data).The problem for many researchers, however, is that they have perfectly serviceable microscopes that they routinely use that have no digital imaging capabilities with little hope of purchasing a new instrument.


Author(s):  
Xiao Zhang

Polymer microscopy involves multiple imaging techniques. Speed, simplicity, and productivity are key factors in running an industrial polymer microscopy lab. In polymer science, the morphology of a multi-phase blend is often the link between process and properties. The extent to which the researcher can quantify the morphology determines the strength of the link. To aid the polymer microscopist in these tasks, digital imaging systems are becoming more prevalent. Advances in computers, digital imaging hardware and software, and network technologies have made it possible to implement digital imaging systems in industrial microscopy labs.


Author(s):  
M. T. Postek ◽  
A. E. Vladar

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 × 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 × 4096 resolution or greater. The two major categories of SEM systems to which digital technology have been applied are:In the analog SEM system the scan generator is normally operated in an analog manner and the image is displayed in an analog or "slow scan" mode.


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