High‐intensity ultrasound radiation at over 10 MHz using hydrothermal polycrystalline lead zirconate titanate (PZT) thick film transducer

2005 ◽  
Vol 118 (3) ◽  
pp. 1944-1944
Author(s):  
Mutsuo Ishikawa ◽  
Minoru Kurosawa ◽  
Tomohito Hasegawa ◽  
Akito Endoh ◽  
Shinichi Takeuchi
2002 ◽  
Vol 17 (5) ◽  
pp. 933-935 ◽  
Author(s):  
R. F. Zhang ◽  
J. Ma ◽  
L. B. Kong

Lead zirconate titanate (PbZr0.52Ti0.48O3; PZT) thick film with a thickness of 70 µm was prepared by the electrophoretic deposition method from a raw oxide mixture of PbO, ZrO2, and TiO2. X-ray diffraction and scanning electron microscopy were used to characterize the sintered PZT thick film. Single phase PZT was observed in the films sintered at 900 °C and above. The film sintered at 1000 °C for 30 min exhibited a dielectric constant of 1050 with a dielectric loss of about 0.05 measured at 1 kHz, a maximum polarization of 29 µC/cm2, a remnant polarization of 19 µC/cm2, and a coercive field of 21 kV/cm. This simple process to form PZT thick films may also be applied to the preparation of other multicomponent ceramics and ceramic films.


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