Diffraction Contrast in STEM

Keyword(s):  
Author(s):  
B. Cunningham ◽  
D.G. Ast

There have Been a number of studies of low-angle, θ < 4°, [10] tilt boundaries in the diamond lattice. Dislocations with Burgers vectors a/2<110>, a/2<112>, a<111> and a<001> have been reported in melt-grown bicrystals of germanium, and dislocations with Burgers vectors a<001> and a/2<112> have been reported in hot-pressed bicrystals of silicon. Most of the dislocations were found to be dissociated, the dissociation widths being dependent on the tilt angle. Possible dissociation schemes and formation mechanisms for the a<001> and a<111> dislocations from the interaction of lattice dislocations have recently been given.The present study reports on the dislocation structure of a 10° [10] tilt boundary in chemically vapor deposited silicon. The dislocations in the boundary were spaced about 1-3nm apart, making them difficult to resolve by conventional diffraction contrast techniques. The dislocation structure was therefore studied by the lattice-fringe imaging technique.


Author(s):  
John Silcox

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.


Author(s):  
R. J. Horylev ◽  
L. E. Murr

Smith has shown by dark-field electron microscopy of extracted ThO2 particles from TD-nickel (2% ThO2) that they possess single crystal characteristics. It is generally assumed that these particle dispersions are incoherent. However, some diffraction effects associated with the particle images appeared to be similar to coherency strain fields. The present work will demonstrate conclusively that ThO2 dispersed particles in TD-nickel (2% ThO2) and TD-NiCr (2% ThO2, 20% Cr, Ni) are single crystals. Moreover, the diffraction contrast effects are extinction fringes. That is, these effects arise because of the particle orientation with respect to the electron beam and the extinction conditions for various operating reflections The particles are in fact incoherent.


Author(s):  
Koenraad G F Janssens ◽  
Omer Van der Biest ◽  
Jan Vanhellemont ◽  
Herman E Maes ◽  
Robert Hull

There is a growing need for elastic strain characterization techniques with submicrometer resolution in several engineering technologies. In advanced material science and engineering the quantitative knowledge of elastic strain, e.g. at small particles or fibers in reinforced composite materials, can lead to a better understanding of the underlying physical mechanisms and thus to an optimization of material production processes. In advanced semiconductor processing and technology, the current size of micro-electronic devices requires an increasing effort in the analysis and characterization of localized strain. More than 30 years have passed since electron diffraction contrast imaging (EDCI) was used for the first time to analyse the local strain field in and around small coherent precipitates1. In later stages the same technique was used to identify straight dislocations by simulating the EDCI contrast resulting from the strain field of a dislocation and comparing it with experimental observations. Since then the technique was developed further by a small number of researchers, most of whom programmed their own dedicated algorithms to solve the problem of EDCI image simulation for the particular problem they were studying at the time.


Author(s):  
Stuart McKernan

For many years the concept of quantitative diffraction contrast experiments might have consisted of the determination of dislocation Burgers vectors using a g.b = 0 criterion from several different 2-beam images. Since the advent of the personal computer revolution, the available computing power for performing image-processing and image-simulation calculations is enormous and ubiquitous. Several programs now exist to perform simulations of diffraction contrast images using various approximations. The most common approximations are the use of only 2-beams or a single systematic row to calculate the image contrast, or calculating the image using a column approximation. The increasing amount of literature showing comparisons of experimental and simulated images shows that it is possible to obtain very close agreement between the two images; although the choice of parameters used, and the assumptions made, in performing the calculation must be properly dealt with. The simulation of the images of defects in materials has, in many cases, therefore become a tractable problem.


Author(s):  
Vladimir Yu. Kolosov ◽  
Anders R. Thölén

In this paper we give a short overview of two TEM applications utilizing the extinction bend contour technique (BC) giving the advantages and disadvantages; especially we consider two areas in which the BC technique remains unique. Special attention is given to an approach including computer simulations of TEM micrographs.BC patterns are often observed in TEM studies but are rarely exploited in a serious way. However, this type of diffraction contrast was one of the first to be used for analysis of imperfections in crystalline foils, but since then only some groups have utilized the BC technique. The most extensive studies were performed by Steeds, Eades and colleagues. They were the first to demonstrate the unique possibilities of the BC method and named it real space crystallography, which developed later into the somewhat similar but more powerful convergent beam method. Maybe, due to the difficulties in analysis, BCs have seldom been used in TEM, and then mainly to visualize different imperfections and transformations.


Author(s):  
K. Urban ◽  
Z. Zhang ◽  
M. Wollgarten ◽  
D. Gratias

Recently dislocations have been observed by electron microscopy in the icosahedral quasicrystalline (IQ) phase of Al65Cu20Fe15. These dislocations exhibit diffraction contrast similar to that known for dislocations in conventional crystals. The contrast becomes extinct for certain diffraction vectors g. In the following the basis of electron diffraction contrast of dislocations in the IQ phase is described. Taking account of the six-dimensional nature of the Burgers vector a “strong” and a “weak” extinction condition are found.Dislocations in quasicrystals canot be described on the basis of simple shear or insertion of a lattice plane only. In order to achieve a complete characterization of these dislocations it is advantageous to make use of the one to one correspondence of the lattice geometry in our three-dimensional space (R3) and that in the six-dimensional reference space (R6) where full periodicity is recovered . Therefore the contrast extinction condition has to be written as gpbp + gobo = 0 (1). The diffraction vector g and the Burgers vector b decompose into two vectors gp, bp and go, bo in, respectively, the physical and the orthogonal three-dimensional sub-spaces of R6.


2000 ◽  
Vol 6 (S2) ◽  
pp. 156-157
Author(s):  
K.T. Moore ◽  
E.A. Stach ◽  
J.M. Howe ◽  
D.C. Elbert ◽  
D.R. Veblen

When acquiring energy-filtered TEM (EFTEM) images of a crystalline material, the detrimental effects of diffraction contrast can often be seen in raw energy-filtered images (EFI) (i.e., pre-edge and post-edge images), jump-ratio images and elemental maps as residual diffraction contrast. Residual diffraction contrast occurs in raw EFI because of plural scattering (i.e., inelastic-elastic and elastic-inelastic electron scattering) and in jump-ratio images and elemental maps because background removal procedures often are unable to completely account for intensity changes due to dynamical effects (elastic scattering) that occur between pre-edge and post-edge images acquired at different energy losses.It is demonstrated in these experiments that, when examining a planar interface, EFTEM images have increased compositional contrast and decreased residual diffraction contrast when the sample is oriented so that the interface is parallel to the electron beam, but not directly on a zone axis.


2011 ◽  
Vol 17 (S2) ◽  
pp. 978-979
Author(s):  
G Liu ◽  
I Robertson

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2005 ◽  
Vol 106 ◽  
pp. 41-46 ◽  
Author(s):  
Xin Hua Zhu ◽  
Jian Min Zhu ◽  
Shun Hua Zhou ◽  
Zhi Guo Liu ◽  
Nai Ben Ming ◽  
...  

BaTiO3 (BT) nanoparticles were prepared by the hydrothermal technique using different starting materials and the microstructure examined by XRD, SEM, TEM and HRTEM. X-ray diffraction and electron diffraction patterns showed that the nanoparticles were the cubic BaTiO3 phase. The BT nanoparticles prepared from the starting materials of as-prepared titanium hydroxide and barium hydroxide have spherical grain morphology, an average size of 65 nm and a fairly narrow size distribution. A uniform diffraction contrast across each single grain is observed in the TEM images, and the clear lattice fringes (with d110 = 0.28 nm) observed in HRTEM images reveal that well-crystallized BT nanoparticles are synthesized by the hydrothermal method. The edges of the particles are very smooth, with no surface steps. BT nanoparticles with average grain size of 90 nm, synthesized using barium hydroxide and titanium dioxide as the starting materials, show surface facets. In this case a bimodal size distribution of large faceted and smaller particles is observed. Diffraction contrast variation across the particles caused by high strains within the particles is clearly observed. The high strains obviously stem from structural defects formed during hydrothermal synthesis, presumable in the form of lattice OH− ions and their compensation by cation vacancies. HRTEM images demonstrate that surface facets parallel to the (100) and (110) planes and small islands with 3 ~ 4 atomic layer thickness are frequently observed around the edge of the particles.


Sign in / Sign up

Export Citation Format

Share Document