General Modeling Method of Threshold-Type Multivalued Memristor and Its Application in Digital Logic Circuits

2021 ◽  
Vol 31 (16) ◽  
Author(s):  
Xiaoyuan Wang ◽  
Pu Li ◽  
Chenxi Jin ◽  
Zhekang Dong ◽  
Herbert H. C. Iu

This paper presents a general modeling method for threshold-type multivalued memristors. Through this memristor modeling method, it is very simple to establish threshold-type memristor behavior models with different numbers of memristance elements, and these models are verified by numerical MATLAB simulations. A corresponding circuit-level SPICE model of the ternary memristor behavior model is developed and simulated in LTspice, shown to be consistent with the MATLAB results. Finally, the SPICE model is used to design the AND gate, OR gate, and three NOT gates of ternary state-based logic, and the effectiveness of the circuit is proved by LTSpice simulation.

2020 ◽  
Vol 4 (3) ◽  
pp. 29-39
Author(s):  
Sulkhiya Gazieva ◽  

The future of labor market depends upon several factors, long-term innovation and the demographic developments. However, one of the main drivers of technological change in the future is digitalization and central to this development is the production and use of digital logic circuits and its derived technologies, including the computer,the smart phone and the Internet. Especially, smart automation will perhaps not cause e.g.regarding industries, occupations, skills, tasks and duties


2019 ◽  
Vol 13 (4) ◽  
pp. 325-333
Author(s):  
Xu Liu ◽  
Xiaoqiang Di ◽  
Jinqing Li ◽  
Huamin Yang ◽  
Ligang Cong ◽  
...  

Background: User behavior models have been widely used to simulate attack behaviors in the security domain. We revised all patents related to response to attack behavior models. How to decide the protected target against multiple models of attack behaviors is studied. Methods: We utilize one perfect rational and three bounded rational behavior models to simulate attack behaviors in cloud computing, and then investigate cloud provider’s response based on Stackelberg game. The cloud provider plays the role of defender and it is assumed to be intelligent enough to predict the attack behavior model. Based on the prediction accuracy, two schemes are built in two situations. Results: If the defender can predict the attack behavior model accurately, a single-objective game model is built to find the optimal protection strategy; otherwise, a multi-objective game model is built to find the optimal protection strategy. Conclusion: The numerical results prove that the game theoretic model performs better in the corresponding situation.


2021 ◽  
Author(s):  
Tao Peng ◽  
Jing Liao ◽  
HongWei Tao

Author(s):  
Mario Rossainz-López ◽  
Carmen Cerón-Garnica ◽  
Etelvina Archundia-Sierra ◽  
Patricia Cervantes-Márquez ◽  
David Carrasco-Limón ◽  
...  

2014 ◽  
Vol 1693 ◽  
Author(s):  
David T. Clark ◽  
Robin F. Thompson ◽  
Aled E. Murphy ◽  
David A. Smith ◽  
Ewan P. Ramsay ◽  
...  

ABSTRACTWe present the characteristics of a high temperature CMOS integrated circuit process based on 4H silicon carbide designed to operate at temperatures beyond 300°C. N-channel and P-channel transistor characteristics at room and elevated temperatures are presented. Both channel types show the expected low values of field effect mobility well known in SiC MOSFETS. However the performance achieved is easily capable of exploitation in CMOS digital logic circuits and certain analogue circuits, over a wide temperature range.Data is also presented for the performance of digital logic demonstrator circuits, in particular a 4 to 1 analogue multiplexer and a configurable timer operating over a wide temperature range. Devices are packaged in high temperature ceramic dual in line (DIL) packages, which are capable of greater than 300°C operation. A high temperature “micro-oven” system has been designed and built to enable testing and stressing of units assembled in these package types. This system heats a group of devices together to temperatures of up to 300°C while keeping the electrical connections at much lower temperatures. In addition, long term reliability data for some structures such as contact chains to n-type and p-type SiC and simple logic circuits is summarized.


2020 ◽  
Vol 8 ◽  
pp. 57-61
Author(s):  
Feng Wei ◽  
Xiaole Cui ◽  
Xiaoxin Cui
Keyword(s):  

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